nc-Si/c-Si异质结二极管的电学特性研究

He Yu-liang, Peng Yingcai, Yu Minbin, Liu Ming, Liu Yuexia, X. Gangyi, Luo Jiajun, Wang Tianmin
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引用次数: 0

摘要

制备了晶体硅二极管表面的纳米晶硅薄膜,并对其进行了电学表征。采用等离子体增强化学气相沉积法制备了nc-Si:H薄膜。随着c-Si:H薄膜厚度和c-Si衬底掺杂类型的不同,形成了隧道二极管和异质结二极管两种类型的二极管。在液氮温度范围(/spl sim/77 K)下,隧道二极管的I-V和/spl sigma/-V曲线出现了共振隧穿和量子阶梯现象。异质结二极管具有不同于其他半导体异质结的独特特性。这两种器件都显示了传导机制中的量子隧穿特征。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A study of electrical properties on nc-Si/c-Si heterojunction diodes
Nanocrystalline silicon films on crystalline silicon diodes were fabricated and electrically characterized. The nc-Si:H film was deposited by plasma enhanced chemical vapor deposition. With the difference of the thickness of the nc-Si:H film and the doping type of the c-Si substrate two kinds of diodes, tunneling diodes and heterojunction diodes, were formed. For the tunneling diode, resonant tunneling and quantum staircases were observed in its I-V and /spl sigma/-V curves in liquid nitrogen temperature range (/spl sim/77 K). For heterojunction diodes, we found some unique characters differing from other semiconductor heterojunctions. Both of these devices indicate quantum tunneling features in the conduction mechanism.
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