理解和量化开关电感电源的ids - vd重叠损耗

G. Guérin, G. Rincón-Mora
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引用次数: 0

摘要

iv重叠功率损耗对开关电感电源的整体转换效率起着重要的作用,因此有必要清楚地了解其机理。本文提出了一个具有深刻见解的基于设备的表达式模型。该模型考虑了开关mosfet中栅极电容的非线性和动态行为以及互连二极管产生的反向恢复效应,这些在目前的技术水平上基本上是不存在的。计算和模拟的有和没有反向回收的重叠损失在±10%以内。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Understanding and Quantifying iDS-VDSOverlap Losses in Switched-Inductor Power Supplies
IV-overlap power losses play an important role in the overall conversion efficiency of a switched-inductor power supply, which is why a clear understanding of its mechanism is necessary. This paper proposes an insightful model with device-based expressions. The model accounts for the non-linear and dynamic behavior of gate capacitances in switching MOSFETs and reverse-recovery effects produced by interconnected diodes, which are largely absent in the state of the art. Calculated and simulated overlap losses with and without reverse recovery are within ±10%.
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