用计算机断层扫描评价非接触测量的精度

2014 IEEE 12th International Symposium on Applied Machine Intelligence and Informatics (SAMI) Pub Date : 2014-05-29 DOI:10.1109/SAMI.2014.6822429

I. Glodová, J. Bocko

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引用次数: 0

摘要

本文介绍了利用Metrotom设备进行层析测量的可能性和用途。主要目的是评估复杂物体的扫描精度。我们还提出了测量策略的比较，在进行的实验中。在本实验中，我们将被测元件的点云与其CAD模型配对。对于所提出的三种对齐策略中的每一种，我们都重复了配对过程，进行了16次独立的偏差测量，最后分析和评估了所获得的结果。

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Evaluating the precision of contactless measurement using computer tomography

This paper presents the possibilities and usage of metrotomographic measurements using Metrotom device. The main motivation is to evaluate the precision of the scanning for complex objects. We also present a comparison of measuring strategies, which round up in the conducted experiment. In this experiment, we have paired a cloud of points of the measured element with its CAD model. With each one of three presented alignment strategies we repeated the pairing process, carried out 16 independent measurements of deviations and finally analyzed and evaluated the obtained results.

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2014 IEEE 12th International Symposium on Applied Machine Intelligence and Informatics (SAMI)

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