P. Romano, M. Riccio, A. Nigro, A. Guarino, N. Martucciello, G. Grimaldi
{"title":"光子探测器用NCCO超导超薄膜的生长","authors":"P. Romano, M. Riccio, A. Nigro, A. Guarino, N. Martucciello, G. Grimaldi","doi":"10.1109/METROAEROSPACE.2017.7999562","DOIUrl":null,"url":null,"abstract":"The development of novel superconducting photon detectors requires the investigation of non-traditional materials to exploit their specific properties and realize novel/enhanced devices. Nd2−xCexCuO4±5 is a moderate high transition temperature cuprate superconductor exhibiting n-type conduction which properties can be changed by modifying its cerium and oxygen content. Ultra-thin films of this compound have been deposited by dc sputtering technique, and systematically characterized by using X-ray diffraction and electrical measurements. Design and patterning of sample geometries have been performed by optical and electron beam lithography in order to obtain sub-micron wide strips for measurements of photon detection.","PeriodicalId":229414,"journal":{"name":"2017 IEEE International Workshop on Metrology for AeroSpace (MetroAeroSpace)","volume":"31 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Growth of NCCO superconducting ultra-thin films for photon detectors\",\"authors\":\"P. Romano, M. Riccio, A. Nigro, A. Guarino, N. Martucciello, G. Grimaldi\",\"doi\":\"10.1109/METROAEROSPACE.2017.7999562\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The development of novel superconducting photon detectors requires the investigation of non-traditional materials to exploit their specific properties and realize novel/enhanced devices. Nd2−xCexCuO4±5 is a moderate high transition temperature cuprate superconductor exhibiting n-type conduction which properties can be changed by modifying its cerium and oxygen content. Ultra-thin films of this compound have been deposited by dc sputtering technique, and systematically characterized by using X-ray diffraction and electrical measurements. Design and patterning of sample geometries have been performed by optical and electron beam lithography in order to obtain sub-micron wide strips for measurements of photon detection.\",\"PeriodicalId\":229414,\"journal\":{\"name\":\"2017 IEEE International Workshop on Metrology for AeroSpace (MetroAeroSpace)\",\"volume\":\"31 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 IEEE International Workshop on Metrology for AeroSpace (MetroAeroSpace)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/METROAEROSPACE.2017.7999562\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 IEEE International Workshop on Metrology for AeroSpace (MetroAeroSpace)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/METROAEROSPACE.2017.7999562","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Growth of NCCO superconducting ultra-thin films for photon detectors
The development of novel superconducting photon detectors requires the investigation of non-traditional materials to exploit their specific properties and realize novel/enhanced devices. Nd2−xCexCuO4±5 is a moderate high transition temperature cuprate superconductor exhibiting n-type conduction which properties can be changed by modifying its cerium and oxygen content. Ultra-thin films of this compound have been deposited by dc sputtering technique, and systematically characterized by using X-ray diffraction and electrical measurements. Design and patterning of sample geometries have been performed by optical and electron beam lithography in order to obtain sub-micron wide strips for measurements of photon detection.