J. Tschanz, S. Narendra, Y. Ye, B. Bloechel, S. Borkar, V. De
{"title":"微处理器有源泄漏功率控制的动态睡眠晶体管和体偏置","authors":"J. Tschanz, S. Narendra, Y. Ye, B. Bloechel, S. Borkar, V. De","doi":"10.1109/JSSC.2003.818291","DOIUrl":null,"url":null,"abstract":"Sleep transistors and body bias are used to control active leakage for a 32b integer execution core implemented in a 100nm dual V, CMOS technology. A PMOS sleep transistor degrades performance by 4% but offers 20/spl times/ leakage reduction which is further improved with body bias. Time constants for leakage convergence range from 30ns to 300ns allowing 9-44% power savings for idle periods greater than 100 clock cycles.","PeriodicalId":171288,"journal":{"name":"2003 IEEE International Solid-State Circuits Conference, 2003. Digest of Technical Papers. ISSCC.","volume":"4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-10-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"317","resultStr":"{\"title\":\"Dynamic-sleep transistor and body bias for active leakage power control of microprocessors\",\"authors\":\"J. Tschanz, S. Narendra, Y. Ye, B. Bloechel, S. Borkar, V. De\",\"doi\":\"10.1109/JSSC.2003.818291\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Sleep transistors and body bias are used to control active leakage for a 32b integer execution core implemented in a 100nm dual V, CMOS technology. A PMOS sleep transistor degrades performance by 4% but offers 20/spl times/ leakage reduction which is further improved with body bias. Time constants for leakage convergence range from 30ns to 300ns allowing 9-44% power savings for idle periods greater than 100 clock cycles.\",\"PeriodicalId\":171288,\"journal\":{\"name\":\"2003 IEEE International Solid-State Circuits Conference, 2003. Digest of Technical Papers. ISSCC.\",\"volume\":\"4 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2003-10-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"317\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2003 IEEE International Solid-State Circuits Conference, 2003. Digest of Technical Papers. ISSCC.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/JSSC.2003.818291\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2003 IEEE International Solid-State Circuits Conference, 2003. Digest of Technical Papers. ISSCC.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/JSSC.2003.818291","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Dynamic-sleep transistor and body bias for active leakage power control of microprocessors
Sleep transistors and body bias are used to control active leakage for a 32b integer execution core implemented in a 100nm dual V, CMOS technology. A PMOS sleep transistor degrades performance by 4% but offers 20/spl times/ leakage reduction which is further improved with body bias. Time constants for leakage convergence range from 30ns to 300ns allowing 9-44% power savings for idle periods greater than 100 clock cycles.