低温环境下VNA测量校准

2022 24th International Microwave and Radar Conference (MIKON) Pub Date : 2022-09-12 DOI:10.23919/mikon54314.2022.9924695

Przemyslaw Bryndza

{"title":"低温环境下VNA测量校准","authors":"Przemyslaw Bryndza","doi":"10.23919/mikon54314.2022.9924695","DOIUrl":null,"url":null,"abstract":"A scheme to perform VNA calibration in cryogenic environment using mass produced commercially available components is reported. The work involves an evaluation of two Integrated Circuits in temperatures down to 4K, development of a 2 port calibration procedure using 6 standards and measurements of a quasi-complementary diplexer in cryogenics to validate the method.","PeriodicalId":177285,"journal":{"name":"2022 24th International Microwave and Radar Conference (MIKON)","volume":"9 12","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-09-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"VNA measurement calibration in cryogenic environment\",\"authors\":\"Przemyslaw Bryndza\",\"doi\":\"10.23919/mikon54314.2022.9924695\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A scheme to perform VNA calibration in cryogenic environment using mass produced commercially available components is reported. The work involves an evaluation of two Integrated Circuits in temperatures down to 4K, development of a 2 port calibration procedure using 6 standards and measurements of a quasi-complementary diplexer in cryogenics to validate the method.\",\"PeriodicalId\":177285,\"journal\":{\"name\":\"2022 24th International Microwave and Radar Conference (MIKON)\",\"volume\":\"9 12\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-09-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 24th International Microwave and Radar Conference (MIKON)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.23919/mikon54314.2022.9924695\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 24th International Microwave and Radar Conference (MIKON)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/mikon54314.2022.9924695","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 1

摘要

本文报道了一种在低温环境下使用大量生产的商用元件进行VNA校准的方案。这项工作包括在低至4K的温度下对两个集成电路进行评估，使用6种标准开发2端口校准程序，并在低温中对准互补双工器进行测量以验证该方法。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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VNA measurement calibration in cryogenic environment

A scheme to perform VNA calibration in cryogenic environment using mass produced commercially available components is reported. The work involves an evaluation of two Integrated Circuits in temperatures down to 4K, development of a 2 port calibration procedure using 6 standards and measurements of a quasi-complementary diplexer in cryogenics to validate the method.

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2022 24th International Microwave and Radar Conference (MIKON)

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