K. Ohhata, Y. Sakurai, H. Nambu, K. Kanetani, Y. Idei, T. Hiramoto, N. Tamba, K. Yamaguchi, M. Odaka, K. Watanabe, T. Ikeda, N. Homma
{"title":"写周期为2ns的ECL-CMOS RAM的降噪技术","authors":"K. Ohhata, Y. Sakurai, H. Nambu, K. Kanetani, Y. Idei, T. Hiramoto, N. Tamba, K. Yamaguchi, M. Odaka, K. Watanabe, T. Ikeda, N. Homma","doi":"10.1109/BIPOL.1992.274057","DOIUrl":null,"url":null,"abstract":"An ultra-high-speed ECL-CMOS static RAM (SRAM) with a cycle time of 2 ns has been developed. To achieve fast cycle time, three noise reduction techniques are proposed: which are a noise reduction clamp circuit for reducing the Y-select signal noise; a critical damping emitter follower for the overshoot noise; and a twisted-bit line structure with a normally on equalizer for the bit line crosstalk. The authors describe the noise generation mechanisms and the operation of circuits using each of the techniques. Experimental results are also described.<<ETX>>","PeriodicalId":286222,"journal":{"name":"Proceedings of the 1992 Bipolar/BiCMOS Circuits and Technology Meeting","volume":"23 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-10-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"Noise reduction techniques for an ECL-CMOS RAM with a 2 ns write cycle time\",\"authors\":\"K. Ohhata, Y. Sakurai, H. Nambu, K. Kanetani, Y. Idei, T. Hiramoto, N. Tamba, K. Yamaguchi, M. Odaka, K. Watanabe, T. Ikeda, N. Homma\",\"doi\":\"10.1109/BIPOL.1992.274057\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An ultra-high-speed ECL-CMOS static RAM (SRAM) with a cycle time of 2 ns has been developed. To achieve fast cycle time, three noise reduction techniques are proposed: which are a noise reduction clamp circuit for reducing the Y-select signal noise; a critical damping emitter follower for the overshoot noise; and a twisted-bit line structure with a normally on equalizer for the bit line crosstalk. The authors describe the noise generation mechanisms and the operation of circuits using each of the techniques. Experimental results are also described.<<ETX>>\",\"PeriodicalId\":286222,\"journal\":{\"name\":\"Proceedings of the 1992 Bipolar/BiCMOS Circuits and Technology Meeting\",\"volume\":\"23 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-10-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 1992 Bipolar/BiCMOS Circuits and Technology Meeting\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/BIPOL.1992.274057\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 1992 Bipolar/BiCMOS Circuits and Technology Meeting","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/BIPOL.1992.274057","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Noise reduction techniques for an ECL-CMOS RAM with a 2 ns write cycle time
An ultra-high-speed ECL-CMOS static RAM (SRAM) with a cycle time of 2 ns has been developed. To achieve fast cycle time, three noise reduction techniques are proposed: which are a noise reduction clamp circuit for reducing the Y-select signal noise; a critical damping emitter follower for the overshoot noise; and a twisted-bit line structure with a normally on equalizer for the bit line crosstalk. The authors describe the noise generation mechanisms and the operation of circuits using each of the techniques. Experimental results are also described.<>