J.W. Lawton, A. Drake, R. Henderson, L.M. Wein, R. Whitney, D. Zuanich
{"title":"在砷化镓晶圆厂设施中调节晶圆释放的工作量","authors":"J.W. Lawton, A. Drake, R. Henderson, L.M. Wein, R. Whitney, D. Zuanich","doi":"10.1109/ISMSS.1990.66125","DOIUrl":null,"url":null,"abstract":"The workload regulating wafer release policy, that was developed for MWTD's (Hewlett-Packard's Microwave Technology Division) GaAs fabrication facility is described. A discrete-event simulator, ManSim was used to determine its improvements over other wafer release policies, and it was shown that it has the potential to reduce fabrication cycle time by roughly 50%. It is suggested that the plant's historical focus on leading-edge process technology rather than on more traditional measures of manufacturing performance has delayed the recognition of the potential of a policy of this type.<<ETX>>","PeriodicalId":398535,"journal":{"name":"IEEE/SEMI International Symposium on Semiconductor Manufacturing Science","volume":"13 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"23","resultStr":"{\"title\":\"Workload regulating wafer release in a GaAs fab facility\",\"authors\":\"J.W. Lawton, A. Drake, R. Henderson, L.M. Wein, R. Whitney, D. Zuanich\",\"doi\":\"10.1109/ISMSS.1990.66125\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The workload regulating wafer release policy, that was developed for MWTD's (Hewlett-Packard's Microwave Technology Division) GaAs fabrication facility is described. A discrete-event simulator, ManSim was used to determine its improvements over other wafer release policies, and it was shown that it has the potential to reduce fabrication cycle time by roughly 50%. It is suggested that the plant's historical focus on leading-edge process technology rather than on more traditional measures of manufacturing performance has delayed the recognition of the potential of a policy of this type.<<ETX>>\",\"PeriodicalId\":398535,\"journal\":{\"name\":\"IEEE/SEMI International Symposium on Semiconductor Manufacturing Science\",\"volume\":\"13 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1990-05-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"23\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE/SEMI International Symposium on Semiconductor Manufacturing Science\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISMSS.1990.66125\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE/SEMI International Symposium on Semiconductor Manufacturing Science","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISMSS.1990.66125","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Workload regulating wafer release in a GaAs fab facility
The workload regulating wafer release policy, that was developed for MWTD's (Hewlett-Packard's Microwave Technology Division) GaAs fabrication facility is described. A discrete-event simulator, ManSim was used to determine its improvements over other wafer release policies, and it was shown that it has the potential to reduce fabrication cycle time by roughly 50%. It is suggested that the plant's historical focus on leading-edge process technology rather than on more traditional measures of manufacturing performance has delayed the recognition of the potential of a policy of this type.<>