{"title":"高混合小批量半导体产品高精度质量预测的统计研究","authors":"Kosuke Okusa, Toshiya Okazaki, Shunsaku Yasuda","doi":"10.1109/ISSM51728.2020.9377513","DOIUrl":null,"url":null,"abstract":"Accurate prediction of product performance is very important in semiconductor manufacturing processes. Manufacturing plants with high-mix low-volume types face the problem of having to create many quality prediction models with a small sample size. In this high-mix-low-volume-type plant, the construction of a highly efficient and accurate prediction model for product performance is an important issue. In this study, we propose a quality prediction model based on the hierarchical Bayesian model that can predict quality with high accuracy even for a small number of samples.","PeriodicalId":270309,"journal":{"name":"2020 International Symposium on Semiconductor Manufacturing (ISSM)","volume":"6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-12-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A Statistical Study on Highly Accurate Quality Prediction for High-mix Low-Volume Semiconductor Products\",\"authors\":\"Kosuke Okusa, Toshiya Okazaki, Shunsaku Yasuda\",\"doi\":\"10.1109/ISSM51728.2020.9377513\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Accurate prediction of product performance is very important in semiconductor manufacturing processes. Manufacturing plants with high-mix low-volume types face the problem of having to create many quality prediction models with a small sample size. In this high-mix-low-volume-type plant, the construction of a highly efficient and accurate prediction model for product performance is an important issue. In this study, we propose a quality prediction model based on the hierarchical Bayesian model that can predict quality with high accuracy even for a small number of samples.\",\"PeriodicalId\":270309,\"journal\":{\"name\":\"2020 International Symposium on Semiconductor Manufacturing (ISSM)\",\"volume\":\"6 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-12-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 International Symposium on Semiconductor Manufacturing (ISSM)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISSM51728.2020.9377513\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 International Symposium on Semiconductor Manufacturing (ISSM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSM51728.2020.9377513","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A Statistical Study on Highly Accurate Quality Prediction for High-mix Low-Volume Semiconductor Products
Accurate prediction of product performance is very important in semiconductor manufacturing processes. Manufacturing plants with high-mix low-volume types face the problem of having to create many quality prediction models with a small sample size. In this high-mix-low-volume-type plant, the construction of a highly efficient and accurate prediction model for product performance is an important issue. In this study, we propose a quality prediction model based on the hierarchical Bayesian model that can predict quality with high accuracy even for a small number of samples.