{"title":"面向研究生环境的异构微系统测试设计","authors":"P. Stokes, R. Mallard","doi":"10.1109/MSE.2009.5270823","DOIUrl":null,"url":null,"abstract":"Advances in the microfabrication of heterogeneous microsystems is enabling increasingly complex devices. Modeling, simulation and test methodologies are unable to keep pace. Custom test solutions require significant resources to implement and are often not reusable. Devices not performing as expected are difficult to diagnose. Design-for-testability techniques familiar to silicon microelectronics designers may offer solutions for validating and debugging designs. What is desirable is a system design and operational algorithm optimization in a rapid prototyping environment that incorporates design for testability considerations. The university research setting is particularly well suited for developing such an environment. In this paper, we review some of the generic tests performed on microsystems-based sensor systems by graduate students. Taking a research infrastructure perspective, we then propose improvements to proof of concept environments in universities to facilitate addition of design-for-test features into heterogeneous microsystems.","PeriodicalId":241566,"journal":{"name":"2009 IEEE International Conference on Microelectronic Systems Education","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Towards heterogeneous microsystems design-for-test in a graduate student environment\",\"authors\":\"P. Stokes, R. Mallard\",\"doi\":\"10.1109/MSE.2009.5270823\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Advances in the microfabrication of heterogeneous microsystems is enabling increasingly complex devices. Modeling, simulation and test methodologies are unable to keep pace. Custom test solutions require significant resources to implement and are often not reusable. Devices not performing as expected are difficult to diagnose. Design-for-testability techniques familiar to silicon microelectronics designers may offer solutions for validating and debugging designs. What is desirable is a system design and operational algorithm optimization in a rapid prototyping environment that incorporates design for testability considerations. The university research setting is particularly well suited for developing such an environment. In this paper, we review some of the generic tests performed on microsystems-based sensor systems by graduate students. Taking a research infrastructure perspective, we then propose improvements to proof of concept environments in universities to facilitate addition of design-for-test features into heterogeneous microsystems.\",\"PeriodicalId\":241566,\"journal\":{\"name\":\"2009 IEEE International Conference on Microelectronic Systems Education\",\"volume\":\"18 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-07-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 IEEE International Conference on Microelectronic Systems Education\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MSE.2009.5270823\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 IEEE International Conference on Microelectronic Systems Education","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MSE.2009.5270823","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Towards heterogeneous microsystems design-for-test in a graduate student environment
Advances in the microfabrication of heterogeneous microsystems is enabling increasingly complex devices. Modeling, simulation and test methodologies are unable to keep pace. Custom test solutions require significant resources to implement and are often not reusable. Devices not performing as expected are difficult to diagnose. Design-for-testability techniques familiar to silicon microelectronics designers may offer solutions for validating and debugging designs. What is desirable is a system design and operational algorithm optimization in a rapid prototyping environment that incorporates design for testability considerations. The university research setting is particularly well suited for developing such an environment. In this paper, we review some of the generic tests performed on microsystems-based sensor systems by graduate students. Taking a research infrastructure perspective, we then propose improvements to proof of concept environments in universities to facilitate addition of design-for-test features into heterogeneous microsystems.