{"title":"TSS测试控制器板","authors":"K. Kornegay, R. Brodersen","doi":"10.1109/GLSV.1991.143939","DOIUrl":null,"url":null,"abstract":"The design of a test controller board for a test support system is presented in this paper. Driven by the SCANTEST software, the test controller board exercises the boundary-scan and scan-path and built-in-self-test hardware implemented on the device under test via a dedicated test-bus. An analog test feature is also described.<<ETX>>","PeriodicalId":261873,"journal":{"name":"[1991] Proceedings. First Great Lakes Symposium on VLSI","volume":"12 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"A test controller board for TSS\",\"authors\":\"K. Kornegay, R. Brodersen\",\"doi\":\"10.1109/GLSV.1991.143939\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The design of a test controller board for a test support system is presented in this paper. Driven by the SCANTEST software, the test controller board exercises the boundary-scan and scan-path and built-in-self-test hardware implemented on the device under test via a dedicated test-bus. An analog test feature is also described.<<ETX>>\",\"PeriodicalId\":261873,\"journal\":{\"name\":\"[1991] Proceedings. First Great Lakes Symposium on VLSI\",\"volume\":\"12 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-03-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"[1991] Proceedings. First Great Lakes Symposium on VLSI\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/GLSV.1991.143939\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"[1991] Proceedings. First Great Lakes Symposium on VLSI","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/GLSV.1991.143939","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The design of a test controller board for a test support system is presented in this paper. Driven by the SCANTEST software, the test controller board exercises the boundary-scan and scan-path and built-in-self-test hardware implemented on the device under test via a dedicated test-bus. An analog test feature is also described.<>