在NIST PEB测试台上校准50°C至230°C的低温无电缆光管高温计

B. Tsai, K. Kreider, W. Kimes
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引用次数: 0

摘要

无电缆光管辐射温度计(CLRT)的出现导致了CLRT校准和测量精度的显着提高。CLRT系统通过消除长光纤电缆及其连接引起的不确定性,并通过扩展光谱范围以处理低温应用到环境条件,在非接触式测量中显示出巨大的前景。在美国国家标准与技术研究院(NIST), CLRT的校准是在50°c到230°c的水热管黑体源下进行的。此外,CLRT还与NIST在暴露后烘烤测试台上加热的硅片上的接触式温度计进行了比较。将CLRT与黑体和热电偶标准进行比较,为使用CLRT提供了信心,并使研究人员能够继续研究提高CLRT在半导体加工中应用的准确性和可行性
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Calibration of Low Temperature Cable-Less Lightpipe Pyrometer on the NIST PEB Test Bed Between 50 °C and 230 °C
The advent of the cable-less lightpipe radiation thermometer (CLRT) has resulted in a significant improvement in the accuracy of CLRT calibrations and measurements. CLRT systems show great promise in noncontact measurements by the elimination of the uncertainties caused by the long fiber optic cables and their connections and by the extension of the spectral range to handle low temperature applications down to ambient conditions. Calibration of the CLRT at the National Institute of Standards and Technology (NIST) is performed with the water heat pipe blackbody source between 50 degC and 230 degC. In addition, the CLRT is compared to contact thermometers on a silicon wafer heated in a post-exposure bake test bed at NIST. Comparison of the CLRT with both the blackbody and thermocouple standards provide confidence in using CLRTs and allow researchers to continued research in improving the accuracy and feasibility of applying CLRTs in semiconductor processing
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