1149.4基于在线静态状态监测技术[模拟DFT]

Proceedings. 21st VLSI Test Symposium, 2003. Pub Date : 2003-04-27 DOI:10.1109/VTEST.2003.1197651

C. Su, Chih-hu Wang, Wei-Juo Wang, I. Tseng

{"title":"1149.4基于在线静态状态监测技术[模拟DFT]","authors":"C. Su, Chih-hu Wang, Wei-Juo Wang, I. Tseng","doi":"10.1109/VTEST.2003.1197651","DOIUrl":null,"url":null,"abstract":"On-line quiescent state monitoring is achieved by utilizing dual comparators compatible with the IEEE 1149.4 standard analog DFT. Statistical analysis is used to minimize the impacts of dynamic signals and noise carried in the signal line. The experimental results confirm the mathematical analysis and assure the test methodology.","PeriodicalId":292996,"journal":{"name":"Proceedings. 21st VLSI Test Symposium, 2003.","volume":"23 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-04-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"1149.4 based on-line quiescent state monitoring technique [analog DFT]\",\"authors\":\"C. Su, Chih-hu Wang, Wei-Juo Wang, I. Tseng\",\"doi\":\"10.1109/VTEST.2003.1197651\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"On-line quiescent state monitoring is achieved by utilizing dual comparators compatible with the IEEE 1149.4 standard analog DFT. Statistical analysis is used to minimize the impacts of dynamic signals and noise carried in the signal line. The experimental results confirm the mathematical analysis and assure the test methodology.\",\"PeriodicalId\":292996,\"journal\":{\"name\":\"Proceedings. 21st VLSI Test Symposium, 2003.\",\"volume\":\"23 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2003-04-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings. 21st VLSI Test Symposium, 2003.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VTEST.2003.1197651\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings. 21st VLSI Test Symposium, 2003.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTEST.2003.1197651","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 3

摘要

通过使用与IEEE 1149.4标准模拟DFT兼容的双比较器实现在线静态状态监测。采用统计分析的方法，将信号线中携带的动态信号和噪声的影响降到最低。实验结果证实了数学分析的正确性，保证了试验方法的正确性。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

1149.4 based on-line quiescent state monitoring technique [analog DFT]

On-line quiescent state monitoring is achieved by utilizing dual comparators compatible with the IEEE 1149.4 standard analog DFT. Statistical analysis is used to minimize the impacts of dynamic signals and noise carried in the signal line. The experimental results confirm the mathematical analysis and assure the test methodology.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

Proceedings. 21st VLSI Test Symposium, 2003.

自引率

0.00%

发文量