W. Tang, J. Zhao, Y. Huang, L. Ding, S. Chen, X. Guo
{"title":"低k/高k双层栅极电介质低压聚合物OTFTs偏置应力稳定性的改善","authors":"W. Tang, J. Zhao, Y. Huang, L. Ding, S. Chen, X. Guo","doi":"10.1109/CAD-TFT.2016.7785044","DOIUrl":null,"url":null,"abstract":"Low-voltage solution-processed organic thin-film transistors (OTFTs) were developed using a large permittivity (high-k) polymer P(VDF-TrFE-CFE). It was shown that by inserting a thin, low-polar dielectric layer (CYTOP) between the high-k one and the channel, the bias stability was much improved due to screening of the dipole field from high-k dielectric.","PeriodicalId":303429,"journal":{"name":"2016 7th International Conference on Computer Aided Design for Thin-Film Transistor Technologies (CAD-TFT)","volume":"47 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Improved bias stress stability for low-voltage polymer OTFTs with low-k/high-k bilayer gate dielectric\",\"authors\":\"W. Tang, J. Zhao, Y. Huang, L. Ding, S. Chen, X. Guo\",\"doi\":\"10.1109/CAD-TFT.2016.7785044\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Low-voltage solution-processed organic thin-film transistors (OTFTs) were developed using a large permittivity (high-k) polymer P(VDF-TrFE-CFE). It was shown that by inserting a thin, low-polar dielectric layer (CYTOP) between the high-k one and the channel, the bias stability was much improved due to screening of the dipole field from high-k dielectric.\",\"PeriodicalId\":303429,\"journal\":{\"name\":\"2016 7th International Conference on Computer Aided Design for Thin-Film Transistor Technologies (CAD-TFT)\",\"volume\":\"47 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 7th International Conference on Computer Aided Design for Thin-Film Transistor Technologies (CAD-TFT)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CAD-TFT.2016.7785044\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 7th International Conference on Computer Aided Design for Thin-Film Transistor Technologies (CAD-TFT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CAD-TFT.2016.7785044","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Improved bias stress stability for low-voltage polymer OTFTs with low-k/high-k bilayer gate dielectric
Low-voltage solution-processed organic thin-film transistors (OTFTs) were developed using a large permittivity (high-k) polymer P(VDF-TrFE-CFE). It was shown that by inserting a thin, low-polar dielectric layer (CYTOP) between the high-k one and the channel, the bias stability was much improved due to screening of the dipole field from high-k dielectric.