在基于跟踪缓冲的硅调试中使用非平凡逻辑含义

S. Prabhakar, M. Hsiao
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引用次数: 52

摘要

一种有效的硅调试技术使用跟踪缓冲器来监视和捕获电路在其功能性后硅操作期间的一部分响应。由于可用跟踪缓冲区的空间有限,在硅后验证期间,关键跟踪信号的选择在最小化跟踪信号数量和最大化其他未跟踪信号的可观察性/可恢复性方面起着重要作用。本文提出了一种用于后硅调试的跟踪缓冲信号选择的新方法。选择是通过支持那些具有最多的含义的信号来执行的,而这些含义没有被其他信号所暗示。然后,根据硅调试过程中跟踪信号的值,提出了一种利用基于sat的多节点隐含引擎跨多个时间帧恢复未跟踪信号值的算法。序列基准电路的实验结果表明,该方法可以有效地选择跟踪信号,与其他方法相比,具有较高的恢复率。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Using Non-trivial Logic Implications for Trace Buffer-Based Silicon Debug
An effective silicon debug technique uses a trace buffer to monitor and capture a portion of the circuit response during its functional, post-silicon operation. Due to the limited space of the available trace buffer, selection of the critical trace signals plays an important role in both minimizing the number of signals traced and maximizing the observability/restorability of other untraced signals during post-silicon validation. This paper presents a new method for trace buffer signal selection for the purpose of post-silicon debug. The selection is performed by favoring those signals with the most number of implications that are not implied by other signals. Then, based on the values of the traced signals during silicon debug, we introduce an algorithm which uses a SAT-based multi-node implication engine to restore the values of untraced signals across multiple time-frames. Experimental results for sequential benchmark circuits showed that the proposed approach selects the trace signals effectively, giving a high restoration percentage compared with other techniques.
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