证明了局部穷举测试的Akers算法给出了最多四个输出的组合电路的最小测试集

Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS) Pub Date : 1993-11-16 DOI:10.1109/ATS.1993.398773

H. Michinishi, T. Yokohira, T. Okamoto

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引用次数: 1

摘要

在本文中，我们证明了局部穷举测试的Akers测试生成算法对每个最多有四个输出的组合电路(CUT)给出了最小测试集(MLTS)。也就是说，我们澄清了Akers的测试模式生成器可以为这样的CUT生成MLTS。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Proof that Akers' algorithm for locally exhaustive testing gives minimum test sets of combinational circuits with up to four outputs

In this paper, we prove that Akers' test generation algorithm for the locally exhaustive testing gives a minimum test set (MLTS) for every combinational circuit (CUT) with up to four outputs. That is, we clarify that Akers' test pattern generator can generate an MLTS for such CUT.<>

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Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS)

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