{"title":"片上供电电流监测单元采用磁力传感","authors":"M. Donoval, M. Daricek, V. Stopjaková, J. Marek","doi":"10.1109/ICECS.2008.4675081","DOIUrl":null,"url":null,"abstract":"A built-in on-chip current sensors design based on magnetic force of is presented. The proposed sensors are aimed to be used for on-chip current testing in deep-submicron circuits with ultra low-voltage power supply. The advantage of the proposed monitors is mainly elimination of the undesired supply voltage reduction, commonly created by standard current test methods. Description of different sensor architectures, their designs and physical implementations on chip are presented. All the sensor versions were designed in 1.0 mum BiCMOS technology.","PeriodicalId":404629,"journal":{"name":"2008 15th IEEE International Conference on Electronics, Circuits and Systems","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-11-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"On-chip supply current monitoring units using magnetic force sensing\",\"authors\":\"M. Donoval, M. Daricek, V. Stopjaková, J. Marek\",\"doi\":\"10.1109/ICECS.2008.4675081\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A built-in on-chip current sensors design based on magnetic force of is presented. The proposed sensors are aimed to be used for on-chip current testing in deep-submicron circuits with ultra low-voltage power supply. The advantage of the proposed monitors is mainly elimination of the undesired supply voltage reduction, commonly created by standard current test methods. Description of different sensor architectures, their designs and physical implementations on chip are presented. All the sensor versions were designed in 1.0 mum BiCMOS technology.\",\"PeriodicalId\":404629,\"journal\":{\"name\":\"2008 15th IEEE International Conference on Electronics, Circuits and Systems\",\"volume\":\"10 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-11-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 15th IEEE International Conference on Electronics, Circuits and Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICECS.2008.4675081\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 15th IEEE International Conference on Electronics, Circuits and Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICECS.2008.4675081","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
On-chip supply current monitoring units using magnetic force sensing
A built-in on-chip current sensors design based on magnetic force of is presented. The proposed sensors are aimed to be used for on-chip current testing in deep-submicron circuits with ultra low-voltage power supply. The advantage of the proposed monitors is mainly elimination of the undesired supply voltage reduction, commonly created by standard current test methods. Description of different sensor architectures, their designs and physical implementations on chip are presented. All the sensor versions were designed in 1.0 mum BiCMOS technology.