一个符合p1500标准的包装器和TAM控制器协同设计方案

2005 6th International Conference on ASIC Pub Date : 2005-10-24 DOI:10.1109/ICASIC.2005.1611419

Wu Chao, Wang Hong, Y. Shi-yuan

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摘要

IEEE P1500是一个正在开发中的标准，旨在提高基于核心的soc的测试重用和测试集成的便利性。本文提出了一种符合p1500标准的包装器和TAM控制器的设计方案。在我们的方案中考虑了面积开销和功耗。基于SoC样本的一些实验结果表明，该方法在面积开销方面是有效的

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A P1500-compliant wrapper and TAM controller co-design scheme

IEEE P1500 is a standard under development which intends to improve ease of test reuse and test integration with respect to the core-based SoCs. This paper proposes a P1500-compliant wrapper and TAM controller design scheme. Area overhead and power consumption are taken into account in our scheme. Some experiment results based on a sample SoC are reported, showing the effectiveness of the proposed approach in terms of area overhead

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2005 6th International Conference on ASIC

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