{"title":"辐照后氧化对低密度聚乙烯中电荷输运和俘获的作用","authors":"A. Markiewicz","doi":"10.1109/ISEIM.1995.496559","DOIUrl":null,"url":null,"abstract":"We present TSC and TSD data recorded in the temperature range -80 to 100 /spl deg/C on LDPE samples subjected to an accelerated oxidation before and after exposure to X-irradiation. We show that, contrary to expectation, the oxidation of the samples following the radiation exposure causes a reversal of a TSD peak originally created by X-irradiation. Oxidation of the samples, but without X-irradiation, does not greatly affect the injection temperature but increases the injection level.","PeriodicalId":130178,"journal":{"name":"Proceedings of 1995 International Symposium on Electrical Insulating Materials","volume":"102 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-09-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"The role of post-irradiation oxidation on charge transport and trapping in low density polyethylene\",\"authors\":\"A. Markiewicz\",\"doi\":\"10.1109/ISEIM.1995.496559\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We present TSC and TSD data recorded in the temperature range -80 to 100 /spl deg/C on LDPE samples subjected to an accelerated oxidation before and after exposure to X-irradiation. We show that, contrary to expectation, the oxidation of the samples following the radiation exposure causes a reversal of a TSD peak originally created by X-irradiation. Oxidation of the samples, but without X-irradiation, does not greatly affect the injection temperature but increases the injection level.\",\"PeriodicalId\":130178,\"journal\":{\"name\":\"Proceedings of 1995 International Symposium on Electrical Insulating Materials\",\"volume\":\"102 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1995-09-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of 1995 International Symposium on Electrical Insulating Materials\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEIM.1995.496559\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 1995 International Symposium on Electrical Insulating Materials","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEIM.1995.496559","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The role of post-irradiation oxidation on charge transport and trapping in low density polyethylene
We present TSC and TSD data recorded in the temperature range -80 to 100 /spl deg/C on LDPE samples subjected to an accelerated oxidation before and after exposure to X-irradiation. We show that, contrary to expectation, the oxidation of the samples following the radiation exposure causes a reversal of a TSD peak originally created by X-irradiation. Oxidation of the samples, but without X-irradiation, does not greatly affect the injection temperature but increases the injection level.
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