3月SS:测试所有静态简单的RAM故障

Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT2002) Pub Date : 2002-07-10 DOI:10.1109/MTDT.2002.1029769

S. Hamdioui, A. V. Goor, M. Rodgers

{"title":"3月SS:测试所有静态简单的RAM故障","authors":"S. Hamdioui, A. V. Goor, M. Rodgers","doi":"10.1109/MTDT.2002.1029769","DOIUrl":null,"url":null,"abstract":"This paper presents all simple (i.e., not linked) static fault models that have been shown to exist for random access memories (RAMs), and shows that none of the current industrial march tests has the capability to detect all these faults. It therefore introduces a new test (March SS), with a test length of 22n, that detects all realistic simple static faults in RAMs.","PeriodicalId":230758,"journal":{"name":"Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT2002)","volume":"27 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"147","resultStr":"{\"title\":\"March SS: a test for all static simple RAM faults\",\"authors\":\"S. Hamdioui, A. V. Goor, M. Rodgers\",\"doi\":\"10.1109/MTDT.2002.1029769\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents all simple (i.e., not linked) static fault models that have been shown to exist for random access memories (RAMs), and shows that none of the current industrial march tests has the capability to detect all these faults. It therefore introduces a new test (March SS), with a test length of 22n, that detects all realistic simple static faults in RAMs.\",\"PeriodicalId\":230758,\"journal\":{\"name\":\"Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT2002)\",\"volume\":\"27 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2002-07-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"147\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT2002)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MTDT.2002.1029769\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT2002)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MTDT.2002.1029769","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 147

摘要

本文介绍了随机存取存储器(ram)中存在的所有简单(即不链接)静态故障模型，并表明目前的工业测试都没有能力检测所有这些故障。因此，它引入了一个新的测试(March SS)，测试长度为22n，可以检测ram中所有实际的简单静态故障。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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March SS: a test for all static simple RAM faults

This paper presents all simple (i.e., not linked) static fault models that have been shown to exist for random access memories (RAMs), and shows that none of the current industrial march tests has the capability to detect all these faults. It therefore introduces a new test (March SS), with a test length of 22n, that detects all realistic simple static faults in RAMs.

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Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT2002)

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