直接键合InP/Si衬底上InAs/InP量子点的MOVPE生长

Keiichi Matsumoto, Xinxin Zhang, Yoshonori Kanaya, K. Shimomura
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引用次数: 0

摘要

采用湿法刻蚀和晶圆直接键合技术制备了InP/Si衬底。InP/Si衬底表面非常光滑,没有观察到应变。在衬底上,利用金属有机气相外延(MOVPE)单片生长InAs/InP量子点(QDs)。根据光致发光(PL)测量,与InP衬底上的量子点相比,观察到几乎相同的强度、峰值波长和最大全宽度的一半(FWHM)。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
MOVPE growth of InAs/InP QDs on directly-bonded InP/Si substrate
InP/Si substrate has been fabricated by employing wet-etching and wafer direct bonding technique. The surface of the InP/Si substrate was very smooth and no strain was observed. On top of the substrate, InAs/InP quantum dots (QDs) have been monolithically grown using metal organic vapor phase epitaxy (MOVPE). According to photo-luminescence (PL) measurement, almost the same intensity, peak wavelength and full width half of maximum (FWHM) have been observed compared to QDs on InP substrate.
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