序列电路中atpg生成的测试序列的压缩

[1988] IEEE International Conference on Computer-Aided Design (ICCAD-89) Digest of Technical Papers Pub Date : 1988-12-01 DOI:10.1109/ICCAD.1988.122533

R. Roy, T.M. Niermann, J. Patel, J. Abraham, R. Saleh

{"title":"序列电路中atpg生成的测试序列的压缩","authors":"R. Roy, T.M. Niermann, J. Patel, J. Abraham, R. Saleh","doi":"10.1109/ICCAD.1988.122533","DOIUrl":null,"url":null,"abstract":"Currently available automatic test pattern generators (ATPGs) generate test sets that are nonoptimal in length. The authors describe novel heuristic techniques to reduce the length of the test set for a sequential circuit by compaction of the automatically generated patterns. Based on these techniques, a program has been written in C that achieved a 56%-73% reduction in the test length of a highly sequential circuit obtained from industry.<<ETX>>","PeriodicalId":285078,"journal":{"name":"[1988] IEEE International Conference on Computer-Aided Design (ICCAD-89) Digest of Technical Papers","volume":"59 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1988-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"48","resultStr":"{\"title\":\"Compaction of ATPG-generated test sequences for sequential circuits\",\"authors\":\"R. Roy, T.M. Niermann, J. Patel, J. Abraham, R. Saleh\",\"doi\":\"10.1109/ICCAD.1988.122533\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Currently available automatic test pattern generators (ATPGs) generate test sets that are nonoptimal in length. The authors describe novel heuristic techniques to reduce the length of the test set for a sequential circuit by compaction of the automatically generated patterns. Based on these techniques, a program has been written in C that achieved a 56%-73% reduction in the test length of a highly sequential circuit obtained from industry.<<ETX>>\",\"PeriodicalId\":285078,\"journal\":{\"name\":\"[1988] IEEE International Conference on Computer-Aided Design (ICCAD-89) Digest of Technical Papers\",\"volume\":\"59 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1988-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"48\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"[1988] IEEE International Conference on Computer-Aided Design (ICCAD-89) Digest of Technical Papers\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICCAD.1988.122533\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"[1988] IEEE International Conference on Computer-Aided Design (ICCAD-89) Digest of Technical Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCAD.1988.122533","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 48

摘要

目前可用的自动测试模式生成器(atpg)生成的测试集在长度上不是最优的。作者描述了新颖的启发式技术，通过压缩自动生成的模式来减少顺序电路的测试集的长度。基于这些技术，用C语言编写了一个程序，实现了从工业上获得的高度顺序电路的测试长度减少56%-73%。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Compaction of ATPG-generated test sequences for sequential circuits

Currently available automatic test pattern generators (ATPGs) generate test sets that are nonoptimal in length. The authors describe novel heuristic techniques to reduce the length of the test set for a sequential circuit by compaction of the automatically generated patterns. Based on these techniques, a program has been written in C that achieved a 56%-73% reduction in the test length of a highly sequential circuit obtained from industry.<>

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

[1988] IEEE International Conference on Computer-Aided Design (ICCAD-89) Digest of Technical Papers

自引率

0.00%

发文量