{"title":"面向二维网格片上网络的可扩展测试方法","authors":"Kim Petersén, Johnny Öberg","doi":"10.1109/DATE.2007.364619","DOIUrl":null,"url":null,"abstract":"This paper presents a BIST strategy for testing the NoC interconnect network, and investigates if the strategy is a suitable approach for the task. All switches and links in the NoC are tested with BIST, running at full clock-speed, and in a functional-like mode. The BIST is carried out as a go/no-go BIST operation at start up, or on command. It is shown that the proposed methodology can be applied for different implementations of deflecting switches, and that the test time is limited to a few thousand-clock cycles with fault coverage close to 100%","PeriodicalId":298961,"journal":{"name":"2007 Design, Automation & Test in Europe Conference & Exhibition","volume":"360 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-04-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"60","resultStr":"{\"title\":\"Toward a Scalable Test Methodology for 2D-mesh Network-on-Chips\",\"authors\":\"Kim Petersén, Johnny Öberg\",\"doi\":\"10.1109/DATE.2007.364619\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a BIST strategy for testing the NoC interconnect network, and investigates if the strategy is a suitable approach for the task. All switches and links in the NoC are tested with BIST, running at full clock-speed, and in a functional-like mode. The BIST is carried out as a go/no-go BIST operation at start up, or on command. It is shown that the proposed methodology can be applied for different implementations of deflecting switches, and that the test time is limited to a few thousand-clock cycles with fault coverage close to 100%\",\"PeriodicalId\":298961,\"journal\":{\"name\":\"2007 Design, Automation & Test in Europe Conference & Exhibition\",\"volume\":\"360 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-04-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"60\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 Design, Automation & Test in Europe Conference & Exhibition\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DATE.2007.364619\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 Design, Automation & Test in Europe Conference & Exhibition","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DATE.2007.364619","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Toward a Scalable Test Methodology for 2D-mesh Network-on-Chips
This paper presents a BIST strategy for testing the NoC interconnect network, and investigates if the strategy is a suitable approach for the task. All switches and links in the NoC are tested with BIST, running at full clock-speed, and in a functional-like mode. The BIST is carried out as a go/no-go BIST operation at start up, or on command. It is shown that the proposed methodology can be applied for different implementations of deflecting switches, and that the test time is limited to a few thousand-clock cycles with fault coverage close to 100%
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