{"title":"图灵的不稳定性作为GTOs的失效机制","authors":"A. V. Gorbatyuk, P. Rodin","doi":"10.1109/ISPSD.1994.583728","DOIUrl":null,"url":null,"abstract":"The destructive phenomena caused by the so called Turing's instability (periodic in space) is illustrated for the case of GTO switching-off process. Using the simplified 3D analytical approach it is shown that this instability can emerge when the whole system still remains in the state with the positive differential resistance but the differential resistance of its active \"hidden\" part yet becomes negative. The suggested model explains satisfactorily the experiments on spatially periodic destruction of GTO and predicts the same type of failure behavior for other thyristor-like devices.","PeriodicalId":405897,"journal":{"name":"Proceedings of the 6th International Symposium on Power Semiconductor Devices and Ics","volume":"40 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-05-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Turing's instability as a failure mechanism of GTOs\",\"authors\":\"A. V. Gorbatyuk, P. Rodin\",\"doi\":\"10.1109/ISPSD.1994.583728\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The destructive phenomena caused by the so called Turing's instability (periodic in space) is illustrated for the case of GTO switching-off process. Using the simplified 3D analytical approach it is shown that this instability can emerge when the whole system still remains in the state with the positive differential resistance but the differential resistance of its active \\\"hidden\\\" part yet becomes negative. The suggested model explains satisfactorily the experiments on spatially periodic destruction of GTO and predicts the same type of failure behavior for other thyristor-like devices.\",\"PeriodicalId\":405897,\"journal\":{\"name\":\"Proceedings of the 6th International Symposium on Power Semiconductor Devices and Ics\",\"volume\":\"40 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-05-31\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 6th International Symposium on Power Semiconductor Devices and Ics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISPSD.1994.583728\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 6th International Symposium on Power Semiconductor Devices and Ics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISPSD.1994.583728","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Turing's instability as a failure mechanism of GTOs
The destructive phenomena caused by the so called Turing's instability (periodic in space) is illustrated for the case of GTO switching-off process. Using the simplified 3D analytical approach it is shown that this instability can emerge when the whole system still remains in the state with the positive differential resistance but the differential resistance of its active "hidden" part yet becomes negative. The suggested model explains satisfactorily the experiments on spatially periodic destruction of GTO and predicts the same type of failure behavior for other thyristor-like devices.