图灵的不稳定性作为GTOs的失效机制

A. V. Gorbatyuk, P. Rodin
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引用次数: 1

摘要

以GTO关闭过程为例,说明了图灵不稳定性(空间周期性)引起的破坏现象。利用简化的三维解析方法表明,当整个系统仍处于正微分电阻状态,但其主动“隐藏”部分的微分电阻变为负时,就会出现这种不稳定性。该模型较好地解释了GTO空间周期性破坏的实验结果,并预测了其他类晶闸管器件的相同失效行为。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Turing's instability as a failure mechanism of GTOs
The destructive phenomena caused by the so called Turing's instability (periodic in space) is illustrated for the case of GTO switching-off process. Using the simplified 3D analytical approach it is shown that this instability can emerge when the whole system still remains in the state with the positive differential resistance but the differential resistance of its active "hidden" part yet becomes negative. The suggested model explains satisfactorily the experiments on spatially periodic destruction of GTO and predicts the same type of failure behavior for other thyristor-like devices.
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