{"title":"半导体器件物理建模的半数值方法","authors":"M. Dehmas, A. Azrar, A. Recioui, M. Challal","doi":"10.1109/ACTEA.2009.5227928","DOIUrl":null,"url":null,"abstract":"In this work, the developed mathematical extension of the semi analytical Method of Lines (MoL) for the solution of Poisson's equation which governs the voltage distribution within semiconductor devices is adapted to fit realistic considerations related to the geometry and the electrodes configuration of such structures. The obtained tool is then applied to find the potential profile within a MOS capacitor in deep depletion mode.","PeriodicalId":308909,"journal":{"name":"2009 International Conference on Advances in Computational Tools for Engineering Applications","volume":"240 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-07-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A semi numerical approach for semiconductor devices physical modeling\",\"authors\":\"M. Dehmas, A. Azrar, A. Recioui, M. Challal\",\"doi\":\"10.1109/ACTEA.2009.5227928\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this work, the developed mathematical extension of the semi analytical Method of Lines (MoL) for the solution of Poisson's equation which governs the voltage distribution within semiconductor devices is adapted to fit realistic considerations related to the geometry and the electrodes configuration of such structures. The obtained tool is then applied to find the potential profile within a MOS capacitor in deep depletion mode.\",\"PeriodicalId\":308909,\"journal\":{\"name\":\"2009 International Conference on Advances in Computational Tools for Engineering Applications\",\"volume\":\"240 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-07-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 International Conference on Advances in Computational Tools for Engineering Applications\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ACTEA.2009.5227928\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 International Conference on Advances in Computational Tools for Engineering Applications","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ACTEA.2009.5227928","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A semi numerical approach for semiconductor devices physical modeling
In this work, the developed mathematical extension of the semi analytical Method of Lines (MoL) for the solution of Poisson's equation which governs the voltage distribution within semiconductor devices is adapted to fit realistic considerations related to the geometry and the electrodes configuration of such structures. The obtained tool is then applied to find the potential profile within a MOS capacitor in deep depletion mode.