集成自组装电感与CMOS LC振荡器

A. Mukherjee, S. Vatti, M. Kiziroglou, R. Moseley, C. Papavassiliou, A. Holmes, E. Yeatman
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引用次数: 2

摘要

集成电感器的质量因数(Q)在射频应用中具有重要意义。本文报道了面外金电感与互补金属氧化物半导体(CMOS) LC振荡器的单片集成。最近开发的自组装工艺包括在平面内制造金电感器和随后通过熔化锡铰链的表面张力旋转结构。通过使用后CMOS处理将LC振荡器与自组装电感器集成,证明了该工艺的CMOS兼容性。在1.48 GHz振荡频率下,在100khz频偏下,相位噪声为- 95 dBc/Hz。结果表明,该技术在高Q电感器与商用射频系统集成方面具有广阔的应用前景。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Integration of self-assembled inductors with CMOS LC oscillators
The quality factor (Q) of integrated inductors is of great importance to radio frequency applications. Monolithic integration of out-of-plane Au inductors with Complementary Metal-Oxide-Semiconductor (CMOS) LC oscillators is reported in this paper. The recently developed self-assembly process involves in-plane fabrication of Au inductors and subsequent rotation of the structure by surface tension forces of a melting Sn hinge. The CMOS compatibility of this process is demonstrated through the integration of an LC oscillator with the self-assembled inductor using post-CMOS processing. At a 1.48 GHz oscillation frequency, a phase noise of −95 dBc/Hz is reported at a 100 kHz frequency offset. Obtained results show this technique to be promising for the integration of high Q inductors with commercial RF systems.
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