嵌入式直流链路去耦电容SiC MOSFET功率模块关断浪涌电压的半理论预测

T. Miyazaki, Yuta Okawauchi, H. Otake, K. Nakahara
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引用次数: 2

摘要

本文提出了一种预测双脉冲测试(DPT)中关断浪涌电压(Vsurge)的半理论方法,该方法采用半桥结构的SiC MOSFET晶体管串接功率模块(PM),模块中嵌入直流链路去耦电容。基于mosfet在其瞬态模式下具有通道电阻(Rch)的寄生电容、二极管或电阻,简化了电路方程,但将电容的漏源电压(Vds)依赖性和栅极源电压依赖性Rch纳入电路行为计算中。采用部分元件等效电路(PEEC)方法估计了永磁的杂散电感(Ls)。其他的Ls是通过阻抗测量经验得到的,并初步执行了开关波形。最后,同时求解多个基于基尔霍夫定律的方程。该计算过程是半理论的,并充分预测了在各种条件下进行DPT时观察到的Vsurge。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Semi-Theoretical Prediction of Turn-off Surge Voltage in a SiC MOSFET Power Module with an Embedded DC-link Decoupling Capacitor
This paper presents a semi-theoretical method for predicting the turn-off surge voltage (Vsurge) in double-pulse test (DPT) using a power module (PM) with serially-connected SiC MOSFET transistors structuring half-bridge, in which module a DC-link decoupling capacitor is also embedded. The circuit equations are simplified based on the fact that the MOSFETs act as their own parasitic capacitance, diode, or resistor having channel resistance (Rch) in their transient modes, but the drain-source voltage (Vds) dependency of the capacitances and gate-source voltage dependent Rch are taken into circuit behavior calculations. The partial element equivalent circuit (PEEC) method is used to estimate the stray inductances (Ls) of the PM. Other Ls’s are empirically obtained by impedance measurement and preliminarily performed switching waveforms. Finally, multiple Kirchhoff’s laws-based equations are simultaneously solved. This calculation process is semi-theoretical, and sufficiently predicts the Vsurge observed in DPT performed under various conditions.
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