Yang Shouguo, Zhang Kunhui, Li Yong, T. Weiping, Gao Xiang
{"title":"新型QDUC测试系统的设计与实现","authors":"Yang Shouguo, Zhang Kunhui, Li Yong, T. Weiping, Gao Xiang","doi":"10.1109/ICEMI.2011.6037866","DOIUrl":null,"url":null,"abstract":"With the widely use of digital integration chip (IC), it becomes more and more important to design and develop a test system for special chip. A test system for a new QDUC (Quadrature Digital Upconverter) -AD9957 chip based on MCU and CPLD is designed in this paper. Firstly, the principle and application of AD9957 are introduced briefly. Then the design idea and principle of the system are mainly explained. The paper also presents the structure of hardware, the flow chart of software and the test results. The system has many advantages such as simple structure, practicality and favorable application prospect.","PeriodicalId":321964,"journal":{"name":"IEEE 2011 10th International Conference on Electronic Measurement & Instruments","volume":"24 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Design and implementation of a test system for a new QDUC\",\"authors\":\"Yang Shouguo, Zhang Kunhui, Li Yong, T. Weiping, Gao Xiang\",\"doi\":\"10.1109/ICEMI.2011.6037866\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"With the widely use of digital integration chip (IC), it becomes more and more important to design and develop a test system for special chip. A test system for a new QDUC (Quadrature Digital Upconverter) -AD9957 chip based on MCU and CPLD is designed in this paper. Firstly, the principle and application of AD9957 are introduced briefly. Then the design idea and principle of the system are mainly explained. The paper also presents the structure of hardware, the flow chart of software and the test results. The system has many advantages such as simple structure, practicality and favorable application prospect.\",\"PeriodicalId\":321964,\"journal\":{\"name\":\"IEEE 2011 10th International Conference on Electronic Measurement & Instruments\",\"volume\":\"24 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-10-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE 2011 10th International Conference on Electronic Measurement & Instruments\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICEMI.2011.6037866\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE 2011 10th International Conference on Electronic Measurement & Instruments","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICEMI.2011.6037866","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Design and implementation of a test system for a new QDUC
With the widely use of digital integration chip (IC), it becomes more and more important to design and develop a test system for special chip. A test system for a new QDUC (Quadrature Digital Upconverter) -AD9957 chip based on MCU and CPLD is designed in this paper. Firstly, the principle and application of AD9957 are introduced briefly. Then the design idea and principle of the system are mainly explained. The paper also presents the structure of hardware, the flow chart of software and the test results. The system has many advantages such as simple structure, practicality and favorable application prospect.