J. Miguel, D. Rivas, Y. Lechuga, M. A. Allende, M. Martinez
{"title":"基于振荡的方法应用于可植入心脏装置的低功耗模拟前端","authors":"J. Miguel, D. Rivas, Y. Lechuga, M. A. Allende, M. Martinez","doi":"10.1109/IMS3TW.2015.7177878","DOIUrl":null,"url":null,"abstract":"This paper describes the evaluation of an oscillation-based approach specially thought for testing a low-power analog system that monitors an implantable biomedical device (intelligent stent). Fault simulation analysis has been performed on the basic blocks of the CUT, and oscillation parameters (frequency and amplitude) have been measured at the output of the last system block, an oscillator. Taking advantage of fault reflection from the rest of the blocks, the proposed testing method will avoid the need of adding extra circuitry to convert the different partitions of the CUT into oscillators, reducing circuit complexity and possible performance degradation. The results obtained show that a good fault coverage figure for catastrophic faults can be achieved.","PeriodicalId":370144,"journal":{"name":"2015 IEEE 20th International Mixed-Signals Testing Workshop (IMSTW)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Oscillation-based approach applied to a low-power analog front-end for an implantable cardiac device\",\"authors\":\"J. Miguel, D. Rivas, Y. Lechuga, M. A. Allende, M. Martinez\",\"doi\":\"10.1109/IMS3TW.2015.7177878\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes the evaluation of an oscillation-based approach specially thought for testing a low-power analog system that monitors an implantable biomedical device (intelligent stent). Fault simulation analysis has been performed on the basic blocks of the CUT, and oscillation parameters (frequency and amplitude) have been measured at the output of the last system block, an oscillator. Taking advantage of fault reflection from the rest of the blocks, the proposed testing method will avoid the need of adding extra circuitry to convert the different partitions of the CUT into oscillators, reducing circuit complexity and possible performance degradation. The results obtained show that a good fault coverage figure for catastrophic faults can be achieved.\",\"PeriodicalId\":370144,\"journal\":{\"name\":\"2015 IEEE 20th International Mixed-Signals Testing Workshop (IMSTW)\",\"volume\":\"5 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-06-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 IEEE 20th International Mixed-Signals Testing Workshop (IMSTW)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMS3TW.2015.7177878\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE 20th International Mixed-Signals Testing Workshop (IMSTW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMS3TW.2015.7177878","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Oscillation-based approach applied to a low-power analog front-end for an implantable cardiac device
This paper describes the evaluation of an oscillation-based approach specially thought for testing a low-power analog system that monitors an implantable biomedical device (intelligent stent). Fault simulation analysis has been performed on the basic blocks of the CUT, and oscillation parameters (frequency and amplitude) have been measured at the output of the last system block, an oscillator. Taking advantage of fault reflection from the rest of the blocks, the proposed testing method will avoid the need of adding extra circuitry to convert the different partitions of the CUT into oscillators, reducing circuit complexity and possible performance degradation. The results obtained show that a good fault coverage figure for catastrophic faults can be achieved.