DefSim -用于缺陷仿真的教育集成电路

2005 IEEE International Conference on Microelectronic Systems Education (MSE'05) Pub Date : 2005-06-12 DOI:10.1109/MSE.2005.24

W. Pleskacz, T. Borejko, T. Gugala, P. Pizon, V. Stopjaková

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引用次数: 9

摘要

介绍了教育用集成电路DefSim。该芯片致力于培养学生在数字电路故障模拟和测试图生成方面的技能。它允许应用电压和电流两种测试方法，并在基本数字电路示例中比较它们的效率。制作了DefSim，并对其运行进行了实验验证。

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DefSim - the educational integrated circuit for defect simulation

The educational integrated circuit, DefSim, is described. This chip is dedicated to the development of students' skills in fault simulation and test pattern generation for digital circuits. It allows applying both voltage and current test methods and offers comparing of their efficiencies on basic digital circuit examples. DefSim was manufactured and its operation was verified experimentally.

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2005 IEEE International Conference on Microelectronic Systems Education (MSE'05)

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