{"title":"下一代光刻技术的启示","authors":"W. Trybula","doi":"10.1109/IEMT.1997.626943","DOIUrl":null,"url":null,"abstract":"The semiconductor industry growth continues to be driven to a large extent by steady advancements in microlithography. The SIA Roadmap renewal is underway and \"work-in-process\" predicts accelerating requirements. The 130 nm generation is anticipated to be needed in the year 2003, with the 100 nm generation 3 years later...the path to get there is not obvious! With a potential end to traditional optical lithography, the choices among Extreme Ultraviolet (EUV or soft X-ray), ion beam, projection e-beam, proximity X-ray, or alternative reflective technology is not obvious or guaranteed for success in the time required. The goal is to make a data-driven decision by late 1997. As the concluding paper in this special section on Lithography, this work will look at the implications of entering into a new technology as the industry attempts to maintain the historic growth curve-also called staying on the roadmap. The purpose of this paper is look at the issues and raise the questions that need to be considered before moving to a new technology.","PeriodicalId":227971,"journal":{"name":"Twenty First IEEE/CPMT International Electronics Manufacturing Technology Symposium Proceedings 1997 IEMT Symposium","volume":"35 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-10-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Next generation lithography-implications\",\"authors\":\"W. Trybula\",\"doi\":\"10.1109/IEMT.1997.626943\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The semiconductor industry growth continues to be driven to a large extent by steady advancements in microlithography. The SIA Roadmap renewal is underway and \\\"work-in-process\\\" predicts accelerating requirements. The 130 nm generation is anticipated to be needed in the year 2003, with the 100 nm generation 3 years later...the path to get there is not obvious! With a potential end to traditional optical lithography, the choices among Extreme Ultraviolet (EUV or soft X-ray), ion beam, projection e-beam, proximity X-ray, or alternative reflective technology is not obvious or guaranteed for success in the time required. The goal is to make a data-driven decision by late 1997. As the concluding paper in this special section on Lithography, this work will look at the implications of entering into a new technology as the industry attempts to maintain the historic growth curve-also called staying on the roadmap. The purpose of this paper is look at the issues and raise the questions that need to be considered before moving to a new technology.\",\"PeriodicalId\":227971,\"journal\":{\"name\":\"Twenty First IEEE/CPMT International Electronics Manufacturing Technology Symposium Proceedings 1997 IEMT Symposium\",\"volume\":\"35 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-10-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Twenty First IEEE/CPMT International Electronics Manufacturing Technology Symposium Proceedings 1997 IEMT Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEMT.1997.626943\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Twenty First IEEE/CPMT International Electronics Manufacturing Technology Symposium Proceedings 1997 IEMT Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEMT.1997.626943","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The semiconductor industry growth continues to be driven to a large extent by steady advancements in microlithography. The SIA Roadmap renewal is underway and "work-in-process" predicts accelerating requirements. The 130 nm generation is anticipated to be needed in the year 2003, with the 100 nm generation 3 years later...the path to get there is not obvious! With a potential end to traditional optical lithography, the choices among Extreme Ultraviolet (EUV or soft X-ray), ion beam, projection e-beam, proximity X-ray, or alternative reflective technology is not obvious or guaranteed for success in the time required. The goal is to make a data-driven decision by late 1997. As the concluding paper in this special section on Lithography, this work will look at the implications of entering into a new technology as the industry attempts to maintain the historic growth curve-also called staying on the roadmap. The purpose of this paper is look at the issues and raise the questions that need to be considered before moving to a new technology.