{"title":"为什么在HICUM中没有内部集电极电阻?","authors":"M. Schroter, S. Lehmann, A. Pawlak","doi":"10.1109/BCTM.2016.7738944","DOIUrl":null,"url":null,"abstract":"The internal (or epi-) collector region in a bipolar (hetero-)junction transistor strongly determines the bias dependent terminal behavior. Most compact transistor model attempt to capture the current-voltage behavior of the epi-collector by a special equivalent circuit element (and associated analytical formulations) in addition to the usual transfer current source representing just the base region. This paper provides (i) theoretical proof that a separate representation of the epi-collector region in an equivalent circuit is neither required nor necessarily advantageous in terms of accuracy and (ii) a physics-based guide on how to model the epi-collector consistently if a separate description is still desired. The theoretical results are validated by numerical device simulation.","PeriodicalId":431327,"journal":{"name":"2016 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM)","volume":"35 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"Why is there no internal collector resistance in HICUM?\",\"authors\":\"M. Schroter, S. Lehmann, A. Pawlak\",\"doi\":\"10.1109/BCTM.2016.7738944\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The internal (or epi-) collector region in a bipolar (hetero-)junction transistor strongly determines the bias dependent terminal behavior. Most compact transistor model attempt to capture the current-voltage behavior of the epi-collector by a special equivalent circuit element (and associated analytical formulations) in addition to the usual transfer current source representing just the base region. This paper provides (i) theoretical proof that a separate representation of the epi-collector region in an equivalent circuit is neither required nor necessarily advantageous in terms of accuracy and (ii) a physics-based guide on how to model the epi-collector consistently if a separate description is still desired. The theoretical results are validated by numerical device simulation.\",\"PeriodicalId\":431327,\"journal\":{\"name\":\"2016 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM)\",\"volume\":\"35 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/BCTM.2016.7738944\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/BCTM.2016.7738944","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Why is there no internal collector resistance in HICUM?
The internal (or epi-) collector region in a bipolar (hetero-)junction transistor strongly determines the bias dependent terminal behavior. Most compact transistor model attempt to capture the current-voltage behavior of the epi-collector by a special equivalent circuit element (and associated analytical formulations) in addition to the usual transfer current source representing just the base region. This paper provides (i) theoretical proof that a separate representation of the epi-collector region in an equivalent circuit is neither required nor necessarily advantageous in terms of accuracy and (ii) a physics-based guide on how to model the epi-collector consistently if a separate description is still desired. The theoretical results are validated by numerical device simulation.