{"title":"室温下硅衬底上发射1.54 /spl μ m的Mqw激光器的稳定工作","authors":"M. Sugo, H. Mori, Y. Itoh, Y. Sakai, M. Tachikawa","doi":"10.1109/DRC.1991.664670","DOIUrl":null,"url":null,"abstract":"Summary form only given. The MQW laser exhibits no degradation during 500 h of CW operation. Employing a hybrid organometallic vapor-phase epitaxy/vapor-phase epitaxy method, high-quality InP films with a full width at half maximum for the X-ray rocking curve of 110 arcsec, a dislocation density of 10/sup 7/ cm/sup -2/, and low residual stress of 2*10/sup 8/ dyn/cm/sup 2/ were obtained. Results of a preliminary CW aging test at room temperature showed no operational degradation over 500 h with a constant output power of 2 mW per facet. This LD appears to be a promising light source candidate for application to OEICs (optoelectronic integrated circuits). >","PeriodicalId":269691,"journal":{"name":"[1991] 49th Annual Device Research Conference Digest","volume":"8 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-06-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Stable-cw-operation of a Mqw Laser Emitting at 1.54 /spl mu/m on a Si Substrate at Room Temperature\",\"authors\":\"M. Sugo, H. Mori, Y. Itoh, Y. Sakai, M. Tachikawa\",\"doi\":\"10.1109/DRC.1991.664670\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Summary form only given. The MQW laser exhibits no degradation during 500 h of CW operation. Employing a hybrid organometallic vapor-phase epitaxy/vapor-phase epitaxy method, high-quality InP films with a full width at half maximum for the X-ray rocking curve of 110 arcsec, a dislocation density of 10/sup 7/ cm/sup -2/, and low residual stress of 2*10/sup 8/ dyn/cm/sup 2/ were obtained. Results of a preliminary CW aging test at room temperature showed no operational degradation over 500 h with a constant output power of 2 mW per facet. This LD appears to be a promising light source candidate for application to OEICs (optoelectronic integrated circuits). >\",\"PeriodicalId\":269691,\"journal\":{\"name\":\"[1991] 49th Annual Device Research Conference Digest\",\"volume\":\"8 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-06-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"[1991] 49th Annual Device Research Conference Digest\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DRC.1991.664670\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"[1991] 49th Annual Device Research Conference Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DRC.1991.664670","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Stable-cw-operation of a Mqw Laser Emitting at 1.54 /spl mu/m on a Si Substrate at Room Temperature
Summary form only given. The MQW laser exhibits no degradation during 500 h of CW operation. Employing a hybrid organometallic vapor-phase epitaxy/vapor-phase epitaxy method, high-quality InP films with a full width at half maximum for the X-ray rocking curve of 110 arcsec, a dislocation density of 10/sup 7/ cm/sup -2/, and low residual stress of 2*10/sup 8/ dyn/cm/sup 2/ were obtained. Results of a preliminary CW aging test at room temperature showed no operational degradation over 500 h with a constant output power of 2 mW per facet. This LD appears to be a promising light source candidate for application to OEICs (optoelectronic integrated circuits). >