{"title":"伪cmos电路的噪声裕度分析","authors":"Q. Zhao, W. Sun, Y. Liu, H. Yang, J. Zhao, X. Guo","doi":"10.1109/CAD-TFT.2016.7785043","DOIUrl":null,"url":null,"abstract":"Despite the large noise margin merit of pseudo- CMOS logic, its analytical model is absent. In this paper, we derive the static noise margin model for pseudo-CMOS (pseudo- D) logic circuits. Finally, we analyze the impact of design parameters on noise margin. Simulations show the modeling error is about 3%.","PeriodicalId":303429,"journal":{"name":"2016 7th International Conference on Computer Aided Design for Thin-Film Transistor Technologies (CAD-TFT)","volume":"149 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Noise margin analysis for Pseudo-CMOS circuits\",\"authors\":\"Q. Zhao, W. Sun, Y. Liu, H. Yang, J. Zhao, X. Guo\",\"doi\":\"10.1109/CAD-TFT.2016.7785043\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Despite the large noise margin merit of pseudo- CMOS logic, its analytical model is absent. In this paper, we derive the static noise margin model for pseudo-CMOS (pseudo- D) logic circuits. Finally, we analyze the impact of design parameters on noise margin. Simulations show the modeling error is about 3%.\",\"PeriodicalId\":303429,\"journal\":{\"name\":\"2016 7th International Conference on Computer Aided Design for Thin-Film Transistor Technologies (CAD-TFT)\",\"volume\":\"149 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 7th International Conference on Computer Aided Design for Thin-Film Transistor Technologies (CAD-TFT)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CAD-TFT.2016.7785043\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 7th International Conference on Computer Aided Design for Thin-Film Transistor Technologies (CAD-TFT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CAD-TFT.2016.7785043","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Despite the large noise margin merit of pseudo- CMOS logic, its analytical model is absent. In this paper, we derive the static noise margin model for pseudo-CMOS (pseudo- D) logic circuits. Finally, we analyze the impact of design parameters on noise margin. Simulations show the modeling error is about 3%.