ZnxCd1−xS/CdTe光伏缓冲层、前后触点的研究

Md Sharafat Hossain, N. Amin, N. R. Hamzah, M. M. Aliyu, M. A. Matin, T. Razykov, K. Sopian
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引用次数: 3

摘要

利用微电子和光子结构分析(AMPS 1D)模拟器进行了数值分析,以探索更高效率和稳定的ZnxCd1−xS/CdTe电池的可能性。本文研究了几种以氧化铟锡(ITO)和锡酸镉(Cd2SnO4)为前触点,锡酸锌(Zn2SnO4)和氧化锌(ZnO)为缓冲层,碲化锑(Sb2Te3)插入镍(Ni)为后触点的传统(SnO2/CdS/CdTe/Ag) CdTe电池结构,其中CdS由硫化镉锌(ZnxCd1−xS)作为窗口层。采用x=0.05的80 nm的ZnxCd1−xS窗口层、1µm的CdTe层和100 nm无Sb2Te3背接触的Zn2SnO4缓冲层,效率高达18.0%。而ZnO插入的转换效率较低,有Sb2Te3背接触和无Sb2Te3背接触时分别为7.84%和12.26%。研究发现,1µm的CdTe吸收层、70 nm的ZnxCd1−xS (x=0.05)窗口层、100 nm的Zn2SnO4缓冲层和100 nm的Sb2Te3背接触层足以获得高效率(>17.5%)的ZnxCd1−xS/CdTe电池。当温度梯度为- 0.25%/°C时,电池归一化效率随工作温度的升高呈线性下降。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Investigation of buffer layers, front and back contacts for ZnxCd1−xS/CdTe photovoltaic
A numerical analysis has been performed utilizing Analysis of Microelectronic and Photonic Structures (AMPS 1D) simulator to explore the possibility of higher efficiency and stable ZnxCd1−xS/CdTe cells. Several cell structures with indium tin oxide (ITO) and cadmium stannate (Cd2SnO4) as front contact, zinc stannate (Zn2SnO4) and zinc oxide (ZnO) as buffer layer and antimony telluride (Sb2Te3) insertion with Nickle (Ni) as back contact has been investigated in the conventional (SnO2/CdS/CdTe/Ag) CdTe cell structures in which CdS is replaced by zinc cadmium sulphide (ZnxCd1−xS) as window layer. Efficiency as high as 18.0% has been found with 80 nm of ZnxCd1−xS window layer for x=0.05, 1 µm of CdTe layer and 100 nm Zn2SnO4 buffer layer without Sb2Te3 back contact. However, ZnO insertion shows low conversion efficiency of 7.84% and 12.26%, respectively with and without Sb2Te3 back contact. It has been found that 1 µm of CdTe absorber layer, 70 nm of ZnxCd1−xS (x=0.05) window layer, 100 nm of Zn2SnO4 buffer layer and 100 nm Sb2Te3 back contact layer are sufficient for high efficiency (>17.5%) ZnxCd1−xS/CdTe cells. Moreover, it was found that the cell normalized efficiency linearly decreases with the increasing operating temperature at the temperature gradient of −0.25%/°C.
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