Hidetomo Kobayashi, K. Kato, Takuro Ohmaru, S. Yoneda, T. Nishijima, Shuhei Maeda, K. Ohshima, H. Tamura, Hiroyuki Tomatsu, T. Atsumi, Y. Shionoiri, Y. Maehashi, J. Koyama, S. Yamazaki
{"title":"采用晶体in - ga - zn -oxide晶体管,功率门控的盈亏平衡时间为4.9 μs","authors":"Hidetomo Kobayashi, K. Kato, Takuro Ohmaru, S. Yoneda, T. Nishijima, Shuhei Maeda, K. Ohshima, H. Tamura, Hiroyuki Tomatsu, T. Atsumi, Y. Shionoiri, Y. Maehashi, J. Koyama, S. Yamazaki","doi":"10.1109/CoolChips.2013.6547913","DOIUrl":null,"url":null,"abstract":"A processor having a power management unit (PMU) and an 8-bit CPU including flip-flops with shadow memories is fabricated by 0.5-μm Si and 0.8-μm c-axis-aligned crystalline In-Ga-Zn-oxide (CAAC-IGZO) technology. The shadow memories hold data without power supply utilizing low off-state current of CAAC-IGZO FETs. A break-even time (BET) of 4.9μs has been obtained. Good scalability of the processor in writing data to shadow memories and in area (5.7% overhead or less) is also confirmed through simulation and layout, based on flip-flops using 30-nm Si FETs combined with 0.3-μm CAAC-IGZO FETs which show good electronic characteristics and no overhead in area.","PeriodicalId":340576,"journal":{"name":"2013 IEEE COOL Chips XVI","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-04-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"16","resultStr":"{\"title\":\"Processor with 4.9-μs break-even time in power gating using crystalline In-Ga-Zn-oxide transistor\",\"authors\":\"Hidetomo Kobayashi, K. Kato, Takuro Ohmaru, S. Yoneda, T. Nishijima, Shuhei Maeda, K. Ohshima, H. Tamura, Hiroyuki Tomatsu, T. Atsumi, Y. Shionoiri, Y. Maehashi, J. Koyama, S. Yamazaki\",\"doi\":\"10.1109/CoolChips.2013.6547913\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A processor having a power management unit (PMU) and an 8-bit CPU including flip-flops with shadow memories is fabricated by 0.5-μm Si and 0.8-μm c-axis-aligned crystalline In-Ga-Zn-oxide (CAAC-IGZO) technology. The shadow memories hold data without power supply utilizing low off-state current of CAAC-IGZO FETs. A break-even time (BET) of 4.9μs has been obtained. Good scalability of the processor in writing data to shadow memories and in area (5.7% overhead or less) is also confirmed through simulation and layout, based on flip-flops using 30-nm Si FETs combined with 0.3-μm CAAC-IGZO FETs which show good electronic characteristics and no overhead in area.\",\"PeriodicalId\":340576,\"journal\":{\"name\":\"2013 IEEE COOL Chips XVI\",\"volume\":\"18 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-04-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"16\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 IEEE COOL Chips XVI\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CoolChips.2013.6547913\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE COOL Chips XVI","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CoolChips.2013.6547913","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Processor with 4.9-μs break-even time in power gating using crystalline In-Ga-Zn-oxide transistor
A processor having a power management unit (PMU) and an 8-bit CPU including flip-flops with shadow memories is fabricated by 0.5-μm Si and 0.8-μm c-axis-aligned crystalline In-Ga-Zn-oxide (CAAC-IGZO) technology. The shadow memories hold data without power supply utilizing low off-state current of CAAC-IGZO FETs. A break-even time (BET) of 4.9μs has been obtained. Good scalability of the processor in writing data to shadow memories and in area (5.7% overhead or less) is also confirmed through simulation and layout, based on flip-flops using 30-nm Si FETs combined with 0.3-μm CAAC-IGZO FETs which show good electronic characteristics and no overhead in area.