先进制造中对首次正确响应的要求

Boyd Finlay, Niels Rackwitz, Brian Conerney, Eric Warren, David Erdmann, K. Stoddard, A. Weber, T. Scanlon
{"title":"先进制造中对首次正确响应的要求","authors":"Boyd Finlay, Niels Rackwitz, Brian Conerney, Eric Warren, David Erdmann, K. Stoddard, A. Weber, T. Scanlon","doi":"10.1109/ASMC.2018.8373198","DOIUrl":null,"url":null,"abstract":"The rapid pace of device scaling in recent years has outrun the ability of today's generation of semiconductor manufacturing equipment control systems to keep up. New device architectures and the materials and processes used to realize them create sources of variability that require better techniques for real-time sensing, filtering, detection, and response. This is not simply a question of faster data collection of the existing equipment variables. In many cases, the data needed to accurately determine the real-time process conditions are not even available in the equipment, so the traditional time-based techniques and endpoint detection methods for controlling recipe execution are not sufficient… rather, these advanced processes are effectively \"flying blind.\" GLOBALFOUNDRIES, a long-time leader in equipment automation and process control, has addressed these issues by integrating specialty sensors into the broader control environment, effectively closing this gap through a variety of advanced sensorization initiatives that supplement the capabilities of the equipment as delivered by the OEMs. The broad expectations regarding the capabilities of manufacturing equipment and the embedded control systems have recently been described in [1]. Specific examples of advanced sensorization use cases and a standards-based implementation approach have been described in [2]. Now that the measurement gaps for a number of key processes have thus been closed (see Tables 1 and 2), new application opportunities exist for leveraging this enhanced visibility into equipment and process behavior. In particular, the ability to achieve \"first-time-right response\" to a wide variety of process conditions is now a practical reality. This paper highlights a number of these applications possibilities enabled by \"unambiguous signals\" on the equipment, and touches on the integration solution used to present these signals seamlessly to the application environment.","PeriodicalId":349004,"journal":{"name":"2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)","volume":"171 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Requirements for first-time-right response in advanced manufacturing\",\"authors\":\"Boyd Finlay, Niels Rackwitz, Brian Conerney, Eric Warren, David Erdmann, K. Stoddard, A. Weber, T. Scanlon\",\"doi\":\"10.1109/ASMC.2018.8373198\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The rapid pace of device scaling in recent years has outrun the ability of today's generation of semiconductor manufacturing equipment control systems to keep up. New device architectures and the materials and processes used to realize them create sources of variability that require better techniques for real-time sensing, filtering, detection, and response. This is not simply a question of faster data collection of the existing equipment variables. In many cases, the data needed to accurately determine the real-time process conditions are not even available in the equipment, so the traditional time-based techniques and endpoint detection methods for controlling recipe execution are not sufficient… rather, these advanced processes are effectively \\\"flying blind.\\\" GLOBALFOUNDRIES, a long-time leader in equipment automation and process control, has addressed these issues by integrating specialty sensors into the broader control environment, effectively closing this gap through a variety of advanced sensorization initiatives that supplement the capabilities of the equipment as delivered by the OEMs. The broad expectations regarding the capabilities of manufacturing equipment and the embedded control systems have recently been described in [1]. Specific examples of advanced sensorization use cases and a standards-based implementation approach have been described in [2]. Now that the measurement gaps for a number of key processes have thus been closed (see Tables 1 and 2), new application opportunities exist for leveraging this enhanced visibility into equipment and process behavior. In particular, the ability to achieve \\\"first-time-right response\\\" to a wide variety of process conditions is now a practical reality. This paper highlights a number of these applications possibilities enabled by \\\"unambiguous signals\\\" on the equipment, and touches on the integration solution used to present these signals seamlessly to the application environment.\",\"PeriodicalId\":349004,\"journal\":{\"name\":\"2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)\",\"volume\":\"171 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-04-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ASMC.2018.8373198\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASMC.2018.8373198","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

摘要

近年来,器件规模的快速增长已经超过了当今一代半导体制造设备控制系统的能力。新的设备架构以及用于实现它们的材料和工艺创造了变异性的来源,需要更好的实时传感、过滤、检测和响应技术。这不仅仅是一个更快地收集现有设备变量数据的问题。在许多情况下,准确确定实时工艺条件所需的数据甚至无法在设备中获得,因此用于控制配方执行的传统基于时间的技术和端点检测方法是不够的……更确切地说,这些先进的工艺实际上是“盲目的”。GLOBALFOUNDRIES是设备自动化和过程控制领域的长期领导者,通过将专业传感器集成到更广泛的控制环境中来解决这些问题,通过各种先进的传感器计划有效地缩小了这一差距,这些传感器计划补充了原始设备制造商交付的设备的能力。关于制造设备和嵌入式控制系统的能力的广泛期望最近在b[1]中进行了描述。b[2]中描述了高级传感器用例和基于标准的实现方法的具体示例。既然许多关键过程的测量差距已经缩小(参见表1和表2),那么利用这种增强的设备和过程行为可见性的新应用机会就存在了。特别是,对各种工艺条件实现“第一时间正确响应”的能力现在已经成为现实。本文重点介绍了设备上的“明确信号”所支持的许多应用可能性,并涉及用于将这些信号无缝地呈现给应用环境的集成解决方案。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Requirements for first-time-right response in advanced manufacturing
The rapid pace of device scaling in recent years has outrun the ability of today's generation of semiconductor manufacturing equipment control systems to keep up. New device architectures and the materials and processes used to realize them create sources of variability that require better techniques for real-time sensing, filtering, detection, and response. This is not simply a question of faster data collection of the existing equipment variables. In many cases, the data needed to accurately determine the real-time process conditions are not even available in the equipment, so the traditional time-based techniques and endpoint detection methods for controlling recipe execution are not sufficient… rather, these advanced processes are effectively "flying blind." GLOBALFOUNDRIES, a long-time leader in equipment automation and process control, has addressed these issues by integrating specialty sensors into the broader control environment, effectively closing this gap through a variety of advanced sensorization initiatives that supplement the capabilities of the equipment as delivered by the OEMs. The broad expectations regarding the capabilities of manufacturing equipment and the embedded control systems have recently been described in [1]. Specific examples of advanced sensorization use cases and a standards-based implementation approach have been described in [2]. Now that the measurement gaps for a number of key processes have thus been closed (see Tables 1 and 2), new application opportunities exist for leveraging this enhanced visibility into equipment and process behavior. In particular, the ability to achieve "first-time-right response" to a wide variety of process conditions is now a practical reality. This paper highlights a number of these applications possibilities enabled by "unambiguous signals" on the equipment, and touches on the integration solution used to present these signals seamlessly to the application environment.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信