{"title":"测试集失真对脉冲射频测量的影响","authors":"J. DiStefano, M. Harmon","doi":"10.1109/ARFTG.1986.323662","DOIUrl":null,"url":null,"abstract":"An Acceptance Test procedure has been discussed for an automated high-power Microwave Tube Test Set. The development of test thresholds required an understanding of the MTTS capability and TUT normal and anomalous behavior. By means Paired Echo and statistical analysis, test thresholds were developed to assure software certification and MTTS Acceptance Test thresholds. During the Life Cycle of the MTTS both software/hardware changes could be certified by regression analysis using the established thresholds.","PeriodicalId":261285,"journal":{"name":"27th ARFTG Conference Digest","volume":"52 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1986-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"The Effects of Test-Set Distortions on Pulsed-RF Measurements\",\"authors\":\"J. DiStefano, M. Harmon\",\"doi\":\"10.1109/ARFTG.1986.323662\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An Acceptance Test procedure has been discussed for an automated high-power Microwave Tube Test Set. The development of test thresholds required an understanding of the MTTS capability and TUT normal and anomalous behavior. By means Paired Echo and statistical analysis, test thresholds were developed to assure software certification and MTTS Acceptance Test thresholds. During the Life Cycle of the MTTS both software/hardware changes could be certified by regression analysis using the established thresholds.\",\"PeriodicalId\":261285,\"journal\":{\"name\":\"27th ARFTG Conference Digest\",\"volume\":\"52 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1986-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"27th ARFTG Conference Digest\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTG.1986.323662\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"27th ARFTG Conference Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.1986.323662","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The Effects of Test-Set Distortions on Pulsed-RF Measurements
An Acceptance Test procedure has been discussed for an automated high-power Microwave Tube Test Set. The development of test thresholds required an understanding of the MTTS capability and TUT normal and anomalous behavior. By means Paired Echo and statistical analysis, test thresholds were developed to assure software certification and MTTS Acceptance Test thresholds. During the Life Cycle of the MTTS both software/hardware changes could be certified by regression analysis using the established thresholds.
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