{"title":"WSI收缩式分选机的容错性能","authors":"S. Horiguchi","doi":"10.1109/ICWSI.1990.63901","DOIUrl":null,"url":null,"abstract":"Presents a novel redundancy sorting array for WSI implementation. The redundancy sorting array consists of a mesh connected odd-even transposition sort and a modified bitonic sort with spare cells. The fault tolerance performance of the redundancy sorting array is discussed.<<ETX>>","PeriodicalId":206140,"journal":{"name":"1990 Proceedings. International Conference on Wafer Scale Integration","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Fault tolerance performance of WSI systolic sorter\",\"authors\":\"S. Horiguchi\",\"doi\":\"10.1109/ICWSI.1990.63901\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Presents a novel redundancy sorting array for WSI implementation. The redundancy sorting array consists of a mesh connected odd-even transposition sort and a modified bitonic sort with spare cells. The fault tolerance performance of the redundancy sorting array is discussed.<<ETX>>\",\"PeriodicalId\":206140,\"journal\":{\"name\":\"1990 Proceedings. International Conference on Wafer Scale Integration\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1990-01-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1990 Proceedings. International Conference on Wafer Scale Integration\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICWSI.1990.63901\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1990 Proceedings. International Conference on Wafer Scale Integration","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICWSI.1990.63901","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Fault tolerance performance of WSI systolic sorter
Presents a novel redundancy sorting array for WSI implementation. The redundancy sorting array consists of a mesh connected odd-even transposition sort and a modified bitonic sort with spare cells. The fault tolerance performance of the redundancy sorting array is discussed.<>