K. Kakushima, M. Mita, D. Kobayashi, G. Hashiguchi, J. Endo, Y. Wada, H. Fujita
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Micromachined tools for nano technology. Twin nano-probes and nano-scale gap control by integrated microactuators
This paper describes the fabrication and actuation of a novel device composed of twin nano probes. The size of the probes are 200 nm-high, 280 nm-wide and 5 /spl mu/m-long, which are formed by silicon anisotropic etching. The initial gap of about 400 nm between the probes become 84 nm when 101 mW input power was given to the thermal expansion micro actuators integrated with the probes. Precise motion down to 4 nm/mW was confirmed by simultaneous TEM observation.