{"title":"2.64 pJ无参考电源监视器,具有宽温度范围","authors":"Hernán Aparicio, P. Ituero, M. López-Vallejo","doi":"10.1109/VARI.2015.7456555","DOIUrl":null,"url":null,"abstract":"Power supply noise in current nanometer technologies represents a growing risk, specially because of the uncertainties it produces in the critical paths delays which can result in erroneous computations. To tackle with these issues and to have a better power management, power supply monitors are necessary. Traditional approaches use an external reference or are very sensitive to temperature and process variations. In this work we propose a monitor that works without an external reference and is hardened against thermal and process variations. The sensor was designed in the 40 nm CMOS technology node, operating at 1.1 V and has been validated for a temperature range of -40 °C to 125 °C covering all process corners. The sensor is able to detect voltage fluctuations of at least 45 mV, wider than 300 ps in the worst technology corner with a maximum latency of 600 ps and an energy consumption per measurement of 2.64 pJ.","PeriodicalId":299950,"journal":{"name":"2015 International Workshop on CMOS Variability (VARI)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"2.64 pJ reference-free power supply monitor with a wide temperature range\",\"authors\":\"Hernán Aparicio, P. Ituero, M. López-Vallejo\",\"doi\":\"10.1109/VARI.2015.7456555\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Power supply noise in current nanometer technologies represents a growing risk, specially because of the uncertainties it produces in the critical paths delays which can result in erroneous computations. To tackle with these issues and to have a better power management, power supply monitors are necessary. Traditional approaches use an external reference or are very sensitive to temperature and process variations. In this work we propose a monitor that works without an external reference and is hardened against thermal and process variations. The sensor was designed in the 40 nm CMOS technology node, operating at 1.1 V and has been validated for a temperature range of -40 °C to 125 °C covering all process corners. The sensor is able to detect voltage fluctuations of at least 45 mV, wider than 300 ps in the worst technology corner with a maximum latency of 600 ps and an energy consumption per measurement of 2.64 pJ.\",\"PeriodicalId\":299950,\"journal\":{\"name\":\"2015 International Workshop on CMOS Variability (VARI)\",\"volume\":\"10 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 International Workshop on CMOS Variability (VARI)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VARI.2015.7456555\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 International Workshop on CMOS Variability (VARI)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VARI.2015.7456555","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
2.64 pJ reference-free power supply monitor with a wide temperature range
Power supply noise in current nanometer technologies represents a growing risk, specially because of the uncertainties it produces in the critical paths delays which can result in erroneous computations. To tackle with these issues and to have a better power management, power supply monitors are necessary. Traditional approaches use an external reference or are very sensitive to temperature and process variations. In this work we propose a monitor that works without an external reference and is hardened against thermal and process variations. The sensor was designed in the 40 nm CMOS technology node, operating at 1.1 V and has been validated for a temperature range of -40 °C to 125 °C covering all process corners. The sensor is able to detect voltage fluctuations of at least 45 mV, wider than 300 ps in the worst technology corner with a maximum latency of 600 ps and an energy consumption per measurement of 2.64 pJ.