基于处理器核心的设计与测试

P. Marwedel
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引用次数: 6

摘要

本文响应了快速增长的各种内核用于实现片上系统的需求。它特别关注处理器核心。我们给出了一些内核的例子,包括DSP内核和特定应用指令集处理器(asip)。我们提到了这些组件的市场趋势,并触及了设计程序,特别是编译器的使用。最后,我们讨论了基于核心设计的测试问题。现有的解决方案包括边界扫描、嵌入式电路仿真(ICE)、使用处理器资源进行刺激/响应压缩和自检程序。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Processor-core based design and test
This paper responds to the rapidly increasing use of various cores for implementing systems-on-a-chip. It specifically focusses on processor cores. We give some examples of cores, including DSP cores and application-specific instruction-set processors (ASIPs). We mention market trends for these components, and we touch design procedures, in particular the use of compilers. Finally, we discuss the problem of testing core-based designs. Existing solutions include boundary scan, embedded in-circuit emulation (ICE), the use of processor resources for stimuli/response compaction and self-test programs.
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