助熔剂对倒装用无流底填材料性能影响的研究

S. Shi, C. Wong
{"title":"助熔剂对倒装用无流底填材料性能影响的研究","authors":"S. Shi, C. Wong","doi":"10.1109/ECTC.1998.678680","DOIUrl":null,"url":null,"abstract":"As one of the key requirements of the no-flow underfilling process for flip-chip applications, a proper self-fluxing agent must be incorporated in the developed no-flow underfill materials to provide proper fluxing activity during the simultaneous solder reflow and underfill material curing. However, most fluxing agents have some adverse effects on the no-flow underfill material properties and assembly reliability. In this paper, we have extensively investigated the effect of the concentration of the selected fluxing agent on the material properties, interconnect integrity and assembly reliability. Through this work, an optimum concentration window of the fluxing agent is obtained and a routine procedure of evaluating fluxing agents is established.","PeriodicalId":422475,"journal":{"name":"1998 Proceedings. 48th Electronic Components and Technology Conference (Cat. No.98CH36206)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-05-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"46","resultStr":"{\"title\":\"Study of the fluxing agent effects on the properties of no-flow underfill materials for flip-chip applications\",\"authors\":\"S. Shi, C. Wong\",\"doi\":\"10.1109/ECTC.1998.678680\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"As one of the key requirements of the no-flow underfilling process for flip-chip applications, a proper self-fluxing agent must be incorporated in the developed no-flow underfill materials to provide proper fluxing activity during the simultaneous solder reflow and underfill material curing. However, most fluxing agents have some adverse effects on the no-flow underfill material properties and assembly reliability. In this paper, we have extensively investigated the effect of the concentration of the selected fluxing agent on the material properties, interconnect integrity and assembly reliability. Through this work, an optimum concentration window of the fluxing agent is obtained and a routine procedure of evaluating fluxing agents is established.\",\"PeriodicalId\":422475,\"journal\":{\"name\":\"1998 Proceedings. 48th Electronic Components and Technology Conference (Cat. No.98CH36206)\",\"volume\":\"18 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1998-05-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"46\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1998 Proceedings. 48th Electronic Components and Technology Conference (Cat. No.98CH36206)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ECTC.1998.678680\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1998 Proceedings. 48th Electronic Components and Technology Conference (Cat. No.98CH36206)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTC.1998.678680","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 46

摘要

作为倒装芯片无流下填充工艺的关键要求之一,必须在所开发的无流下填充材料中加入适当的自熔剂,以在焊料回流和下填充材料固化的同时提供适当的助熔剂活性。然而,大多数助熔剂对无流底填料的性能和装配可靠性都有一定的不利影响。在本文中,我们广泛地研究了所选助焊剂的浓度对材料性能、互连完整性和装配可靠性的影响。通过这项工作,获得了助熔剂的最佳浓度窗口,并建立了助熔剂的常规评价程序。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Study of the fluxing agent effects on the properties of no-flow underfill materials for flip-chip applications
As one of the key requirements of the no-flow underfilling process for flip-chip applications, a proper self-fluxing agent must be incorporated in the developed no-flow underfill materials to provide proper fluxing activity during the simultaneous solder reflow and underfill material curing. However, most fluxing agents have some adverse effects on the no-flow underfill material properties and assembly reliability. In this paper, we have extensively investigated the effect of the concentration of the selected fluxing agent on the material properties, interconnect integrity and assembly reliability. Through this work, an optimum concentration window of the fluxing agent is obtained and a routine procedure of evaluating fluxing agents is established.
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