电路板变量对QFN封装热性能的影响

T. Montes de Oca, B. Joiner, T. Koschmieder
{"title":"电路板变量对QFN封装热性能的影响","authors":"T. Montes de Oca, B. Joiner, T. Koschmieder","doi":"10.1109/ITHERM.2002.1012499","DOIUrl":null,"url":null,"abstract":"The Quad Flat No-Lead (QFN) package, with its exposed die pad soldered to the printed wiring board (PWB), has a thermal performance highly dependent on the PWB design and thermal environment. This paper documents the impact of the following changes to the PWB on the thermal performance of a 44-lead 9/spl times/9 mm QFN package: PWB overall thickness, board area, PWB internal plane thicknesses, number of plated through hole (PTH) vias, PTH via drill diameter, PTH via plating thickness, and PTH via fill material conductivity. The impact of die size and die attach conductivity is also presented in this paper. The effects of these changes are evaluated with a validated finite element model. Two thermal environments are used to evaluate these variables: (1) natural convection with radiation and (2) constant temperature on the bottom side of PWB. Results are listed using two thermal resistances: junction-to-ambient thermal resistance in natural convection on a 2s2p test board (Theta-JMA) according to EIA/JESD51-6 and junction-to-heat sink (Theta-JS) determined with the bottom of the board held at a constant temperature. Theta-JMA is most sensitive to test board area, number of PTH vias, and test board internal plane thickness. Theta-JS is most sensitive to number of PTH vias. The thermal performance of the QFN is also evaluated in two distinct arrangements meant to illustrate the application environment conditions: (1) in a 3/spl times/3 cluster on a board, and (2) on the board where it is attached to an aluminum heat rail. Heat sinking the bottom of the board allows packages to dissipate more heat for a given junction-to-ambient temperature difference than the packages that rely only on natural convection.","PeriodicalId":299933,"journal":{"name":"ITherm 2002. Eighth Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (Cat. No.02CH37258)","volume":"25 2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"Impact of board variables on the thermal performance of a QFN package\",\"authors\":\"T. Montes de Oca, B. Joiner, T. Koschmieder\",\"doi\":\"10.1109/ITHERM.2002.1012499\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The Quad Flat No-Lead (QFN) package, with its exposed die pad soldered to the printed wiring board (PWB), has a thermal performance highly dependent on the PWB design and thermal environment. This paper documents the impact of the following changes to the PWB on the thermal performance of a 44-lead 9/spl times/9 mm QFN package: PWB overall thickness, board area, PWB internal plane thicknesses, number of plated through hole (PTH) vias, PTH via drill diameter, PTH via plating thickness, and PTH via fill material conductivity. The impact of die size and die attach conductivity is also presented in this paper. The effects of these changes are evaluated with a validated finite element model. Two thermal environments are used to evaluate these variables: (1) natural convection with radiation and (2) constant temperature on the bottom side of PWB. Results are listed using two thermal resistances: junction-to-ambient thermal resistance in natural convection on a 2s2p test board (Theta-JMA) according to EIA/JESD51-6 and junction-to-heat sink (Theta-JS) determined with the bottom of the board held at a constant temperature. Theta-JMA is most sensitive to test board area, number of PTH vias, and test board internal plane thickness. Theta-JS is most sensitive to number of PTH vias. The thermal performance of the QFN is also evaluated in two distinct arrangements meant to illustrate the application environment conditions: (1) in a 3/spl times/3 cluster on a board, and (2) on the board where it is attached to an aluminum heat rail. Heat sinking the bottom of the board allows packages to dissipate more heat for a given junction-to-ambient temperature difference than the packages that rely only on natural convection.\",\"PeriodicalId\":299933,\"journal\":{\"name\":\"ITherm 2002. Eighth Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (Cat. No.02CH37258)\",\"volume\":\"25 2 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2002-08-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ITherm 2002. Eighth Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (Cat. No.02CH37258)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ITHERM.2002.1012499\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ITherm 2002. Eighth Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (Cat. No.02CH37258)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ITHERM.2002.1012499","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8

摘要

Quad Flat No-Lead (QFN)封装,其外露的芯片焊盘焊接在印刷线路板(PWB)上,其热性能高度依赖于PWB设计和热环境。本文记录了以下变化对44引脚9/spl倍/ 9mm QFN封装的热性能的影响:PWB总体厚度、电路板面积、PWB内部平面厚度、镀通孔(PTH)过孔数量、PTH过孔钻直径、PTH过孔镀厚度和PTH过孔填充材料电导率。本文还讨论了模具尺寸和模具附着电导率的影响。这些变化的影响进行了评估与验证的有限元模型。采用两种热环境来评价这些变量:(1)带辐射的自然对流和(2)压水板底部的恒定温度。结果使用两种热阻列出:根据EIA/JESD51-6,在2s2p测试板(Theta-JMA)上自然对流的结对环境热阻,以及在板底部保持恒温的情况下确定的结对散热器(Theta-JS)。Theta-JMA对测试板面积、PTH过孔数量和测试板内平面厚度最为敏感。Theta-JS对PTH过孔的数量最为敏感。QFN的热性能也在两种不同的安排下进行评估,以说明应用环境条件:(1)在板上的3/spl倍/3集群中,以及(2)在板上连接到铝热轨。与仅依靠自然对流的封装相比,电路板底部的散热允许封装在给定的结与环境温差下散发更多的热量。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Impact of board variables on the thermal performance of a QFN package
The Quad Flat No-Lead (QFN) package, with its exposed die pad soldered to the printed wiring board (PWB), has a thermal performance highly dependent on the PWB design and thermal environment. This paper documents the impact of the following changes to the PWB on the thermal performance of a 44-lead 9/spl times/9 mm QFN package: PWB overall thickness, board area, PWB internal plane thicknesses, number of plated through hole (PTH) vias, PTH via drill diameter, PTH via plating thickness, and PTH via fill material conductivity. The impact of die size and die attach conductivity is also presented in this paper. The effects of these changes are evaluated with a validated finite element model. Two thermal environments are used to evaluate these variables: (1) natural convection with radiation and (2) constant temperature on the bottom side of PWB. Results are listed using two thermal resistances: junction-to-ambient thermal resistance in natural convection on a 2s2p test board (Theta-JMA) according to EIA/JESD51-6 and junction-to-heat sink (Theta-JS) determined with the bottom of the board held at a constant temperature. Theta-JMA is most sensitive to test board area, number of PTH vias, and test board internal plane thickness. Theta-JS is most sensitive to number of PTH vias. The thermal performance of the QFN is also evaluated in two distinct arrangements meant to illustrate the application environment conditions: (1) in a 3/spl times/3 cluster on a board, and (2) on the board where it is attached to an aluminum heat rail. Heat sinking the bottom of the board allows packages to dissipate more heat for a given junction-to-ambient temperature difference than the packages that rely only on natural convection.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信