同时开关噪声:平面-平面及平面-信号走线耦合的影响

A. Vaidyanath, B. Thoroddsen, J. Prince, A. Cangellaris
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引用次数: 31

摘要

本文介绍了带配电面封装CMOS驱动器的同步开关噪声(SSN)问题。该分析考虑了配电平面和信号走线之间的相互作用。它们之间的耦合对噪声有重要影响,必须加以考虑。提出了信号导体与配电平面内电流路径相互作用的模型。信号导体的存在被认为对SSN有重大影响。噪声的大小很大程度上取决于信号导体的相对位置以及电源和地平面引脚连接。电源和地平面彼此足够接近也有显著的相互感应耦合。即使开关电流只流过一个平面,这种耦合也会在两个分配平面中观察到噪声。这个效应是可以解释的
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Simultaneous switching noise: influence of plane-plane and plane-signal trace coupling
The paper presents an aspect of Simultaneous Switching Noise (SSN) for CMOS drivers in packages with power distribution planes. The analysis takes into account the interactions between power distribution planes and signal traces. Coupling between these have a significant effect on the noise and must be taken into account. A model for the interaction between the signal conductors and the current paths in the power distribution planes is presented. The presence of the signal conductors is seen to have a significant impact on the SSN. The magnitude of the noise is strongly dependent on the relative positions of the signal conductors and the power and ground plane pin connections. Power and ground planes sufficiently close to each other also have significant mutual inductive coupling. This coupling will cause noise to be observed in both distribution planes, even though switching current flows in only one plane. This effect is explained.<>
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