M. Almada-Gutierrez, F. Sandoval-Ibarra, R. Sánchez-Fraga
{"title":"集成NMOS差分放大器","authors":"M. Almada-Gutierrez, F. Sandoval-Ibarra, R. Sánchez-Fraga","doi":"10.1109/LAEDC54796.2022.9908177","DOIUrl":null,"url":null,"abstract":"A single-channel integrated differential amplifier has been designed using Negative-channel Metal-Oxide-Semiconductor (NMOS) technology. The main interest is to establish the correct operating point. Following the integrated circuit design flow a schematic circuit is proposed, this is designed from an active voltage divider copies whose reference voltages are 0.25VDD and 0.5VDD whereas VDD = 5 V. The circuit simulation has been realized in Virtuoso considering the level 3 SPICE model, and results show that for proposed dc levels (2.5 V and 1.25 V) the devices work in the saturation region, obtaining a low-frequency gain of 18 dB. Finally, a physical design is realized in Electric VLSI considering specific experiments oriented to Design For Test (DFT) in order to perform the integrated circuit testing using on-wafer measurement equipment.","PeriodicalId":276855,"journal":{"name":"2022 IEEE Latin American Electron Devices Conference (LAEDC)","volume":"32 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-07-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Integrated NMOS Differential Amplifier\",\"authors\":\"M. Almada-Gutierrez, F. Sandoval-Ibarra, R. Sánchez-Fraga\",\"doi\":\"10.1109/LAEDC54796.2022.9908177\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A single-channel integrated differential amplifier has been designed using Negative-channel Metal-Oxide-Semiconductor (NMOS) technology. The main interest is to establish the correct operating point. Following the integrated circuit design flow a schematic circuit is proposed, this is designed from an active voltage divider copies whose reference voltages are 0.25VDD and 0.5VDD whereas VDD = 5 V. The circuit simulation has been realized in Virtuoso considering the level 3 SPICE model, and results show that for proposed dc levels (2.5 V and 1.25 V) the devices work in the saturation region, obtaining a low-frequency gain of 18 dB. Finally, a physical design is realized in Electric VLSI considering specific experiments oriented to Design For Test (DFT) in order to perform the integrated circuit testing using on-wafer measurement equipment.\",\"PeriodicalId\":276855,\"journal\":{\"name\":\"2022 IEEE Latin American Electron Devices Conference (LAEDC)\",\"volume\":\"32 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-07-04\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 IEEE Latin American Electron Devices Conference (LAEDC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/LAEDC54796.2022.9908177\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE Latin American Electron Devices Conference (LAEDC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/LAEDC54796.2022.9908177","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A single-channel integrated differential amplifier has been designed using Negative-channel Metal-Oxide-Semiconductor (NMOS) technology. The main interest is to establish the correct operating point. Following the integrated circuit design flow a schematic circuit is proposed, this is designed from an active voltage divider copies whose reference voltages are 0.25VDD and 0.5VDD whereas VDD = 5 V. The circuit simulation has been realized in Virtuoso considering the level 3 SPICE model, and results show that for proposed dc levels (2.5 V and 1.25 V) the devices work in the saturation region, obtaining a low-frequency gain of 18 dB. Finally, a physical design is realized in Electric VLSI considering specific experiments oriented to Design For Test (DFT) in order to perform the integrated circuit testing using on-wafer measurement equipment.