先进商用CMOS技术对空间和医疗应用的兴趣日益浓厚。一种新型纳米功率和辐射硬化SRAM在130nm CMOS上的图示

2008 14th IEEE International On-Line Testing Symposium Pub Date : 2008-07-07 DOI:10.1109/IOLTS.2008.60

P. Roche, Mark Lysinger, G. Gasiot, J. Daveau, M. Zamanian, P. Dautriche

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引用次数: 2

摘要

本文综述了最近的实验证实，商用CMOS技术的固有辐射鲁棒性随着尺寸的减小而自然提高。当另外使用创新的设计技术时，现在可以确保性能和辐射硬度都得到满足。以130 nm CMOS设计的原始纳米功率和抗辐射8mb SRAM为例。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Growing Interest of Advanced Commercial CMOS Technologies for Space and Medical Applications. Illustration with a New Nano-Power and Radiation-Hardened SRAM in 130nm CMOS

This paper reviews recent experimental confirmations that the intrinsic radiation robustness of commercial CMOS technologies naturally improves with the down-scaling. When additionally using innovative design techniques, it becomes now possible to assure that performance and radiation-hardness are both met. An illustration is given with an original nano-power and radiation-hardened 8 Mb SRAM designed in 130 nm CMOS.

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2008 14th IEEE International On-Line Testing Symposium

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