一种新型离子注入抗蚀剂光掩膜

T. Hashimoto, T. Koguchi, Y. Okuyama, K. Yamamoto, K. Takahata, M. Kamoshida, T. Yanagawa
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引用次数: 1

摘要

提出了一种利用离子注入的新型光掩膜制造方法,将高能离子注入到玻璃基板上的图案抗蚀剂中。高能、高剂量离子注入使抗蚀剂薄膜的透光性大大降低,使抗蚀剂的机械耐化学性提高。这些结果适用于光掩模的制作。本文讨论了抗蚀剂种类、抗蚀剂厚度、离子种类、能量和剂量等工艺条件。并对植入光掩膜的光密度、图案清晰度、耐划伤性和化学腐蚀等方面的评价结果进行了讨论。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A new photomask with ion-implanted resist
A novel photomask fabrication method using ion implantation has been developed, where energetic ions are implanted into the patterned resist on a glass substrate. The optical transmission of the resist film was exceedingly decreased and the resist becomes more mechanically and chemically resistant by high energy, high dose ion implantation. These results are suitably applied to photomask fabrication. In this paper process conditions such as types of resist, resist thickness, ion species, energy and dose will be discussed. And some of the evaluation results on the implanted photomasks will be also discussed in relation to optical density, pattern definition, scratch resistance and chemical attacks.
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