{"title":"同轴探头尺寸对宽带过渡到衬底集成波导的影响","authors":"C. Prasad, A. Bishwas","doi":"10.1109/AEMC.2015.7509177","DOIUrl":null,"url":null,"abstract":"The effect of probe dimensions on the excitation of substrate integrated waveguide (SIW) in thick substrate in X (8- 12 GHz) and Ku (12-18 GHz)-frequency band is presented. The SIW is excited by a standard SMA connector and with K-connector and their performances are compared. The proposed transition is simulated using Ansof HFSS. The simulated bandwidth (S11<; -20dB) for standard SMA-to-SIW back-to-back transition is 38.65% and for the K-connector-to-SIW back-to-back transition it is improved up to 61.81%.","PeriodicalId":168839,"journal":{"name":"2015 IEEE Applied Electromagnetics Conference (AEMC)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Effects of coaxial probe dimensions on broadband transition to substrate integrate waveguide\",\"authors\":\"C. Prasad, A. Bishwas\",\"doi\":\"10.1109/AEMC.2015.7509177\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The effect of probe dimensions on the excitation of substrate integrated waveguide (SIW) in thick substrate in X (8- 12 GHz) and Ku (12-18 GHz)-frequency band is presented. The SIW is excited by a standard SMA connector and with K-connector and their performances are compared. The proposed transition is simulated using Ansof HFSS. The simulated bandwidth (S11<; -20dB) for standard SMA-to-SIW back-to-back transition is 38.65% and for the K-connector-to-SIW back-to-back transition it is improved up to 61.81%.\",\"PeriodicalId\":168839,\"journal\":{\"name\":\"2015 IEEE Applied Electromagnetics Conference (AEMC)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 IEEE Applied Electromagnetics Conference (AEMC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AEMC.2015.7509177\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE Applied Electromagnetics Conference (AEMC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AEMC.2015.7509177","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Effects of coaxial probe dimensions on broadband transition to substrate integrate waveguide
The effect of probe dimensions on the excitation of substrate integrated waveguide (SIW) in thick substrate in X (8- 12 GHz) and Ku (12-18 GHz)-frequency band is presented. The SIW is excited by a standard SMA connector and with K-connector and their performances are compared. The proposed transition is simulated using Ansof HFSS. The simulated bandwidth (S11<; -20dB) for standard SMA-to-SIW back-to-back transition is 38.65% and for the K-connector-to-SIW back-to-back transition it is improved up to 61.81%.