化学镀镍/镀铜是一种新的凹凸金属化方法

R. Aschenbrenner, A. Ostmann, U. Beutler, J. Simon, H. Reichl
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引用次数: 30

摘要

提出了一种适用于Rip-Chip和TAB的化学碰撞方法。化学镀镍/铜是一种无掩膜的低成本方法,可以直接撞击铝键垫。在铜上镀有用于涂覆和焊接的浸锡层。由于化学镀铜液的碱度高(pH>12),在铝上需要一层约7 P/spl mu/m的厚Ni层来密封。抗剪强度为180 cN,接触电阻小于2 m/spl ω /。由于镍的硬度高,传统的焊接技术不适用。化学镀铜的硬度在200 mHV25左右,退火后的硬度在130-150 mHV25之间。研究了镀金带与Ni/Cu/Sn镀层的热压键合。平均拉力为50 cN。进一步研究了沉积铜的尺寸和化学焊镀的影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Electroless Nickel/Copper Plating as a New Bump Metallization
An electroless bumping method was developed both for Rip-Chip and TAB applications. Electroless Ni/Cu plating is a maskless low cost approach to bumping directly on aluminum bondpads. An immersion tin layer for coating and soldering is plated on the copper. Due to the high alkalinity (pH>12) of electroless Cu baths, a thick Ni layer of about 7 P/spl mu/m is required on the aluminum for sealing. A shear strength of 180 cN and a contact resistance of less than 2 m/spl omega/ for the bumps were obtained. Because of the high hardness of nickel, conventional gang bonding techniques are not applicable. The hardness of electroless copper is about 200 mHV25 and after annealing in the range of 130-150 mHV25. Thermocompression gang bonding of Au plated tape to the Ni/Cu/Sn metallization was carded out. The average pull strength was 50 cN. Further investigations of the deposited copper are the influence of the size and electroless solder plating.
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